A new on-wafer multiline thru-reflect-line (TRL) calibration standard design

Lu, Haijun; Zhou, Ziyao; Chengwei, Chengwei; Zhou, Jianjun; Chen, Tangshen; Chen, Chen

doi:10.1109/apcap.2014.6992655

Cited by 6 publications

(1 citation statement)

References 4 publications

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“…However, the waveguide method is the same as the free space or transmission line method, which are less accurate due to the unavoidable measurement errors. Although there are calibration standards, such as the Short-Open-Load-Through (SOLT) [15][16][17][18][19][20], the Through-Reflect-Line (TRL) [21][22][23][24], and the multiline TRL [25][26][27][28], that should be performed before the experiments, these methods experience their own respective defects, such as the requirement of multi-measurement cells, or the presence of the air gap effect. This paper proposes a new approach to estimate the complex relative dielectric based on only one measurement of the S-parameters of the sample to eliminate the defects mentioned above by assuming the waveguide cell with the length l is determined to be filled with empty air inside (ε r ≈ 1.0-j0.0) as a layer of dielectric material.…”

Section: Introductionmentioning

confidence: 99%

Accurate Estimation without Calibration of the Complex Relative Permittivity of Multilayer Dielectric Material based on the Finite Integration Technique

2023

Eng. Technol. Appl. Sci. Res.

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In this paper, a simple and effective solution is proposed to accurately estimate the complex relative permittivity of individual layers and multilayers of dielectric material samples from the S-parameters measured by two waveguide cells having equal or different lengths filled with the same vacuum/empty material without having to calibrate before performing experiments. The measurement system is set up by modeling using the Computer Simulation Technology (CST) software. In the modeling, a single layer/multilayer material sample is placed in the X-band rectangular waveguide and it has two ports used for the electromagnetic wave supply and measurement of S-parameters. From the S-parameters measured, the complex relative permittivity of individual layers and the multilayers of the material samples are estimated by the proposed method. The known single-layer and multilayer materials such as Garlock, Bakelite, and Teflon have different dielectric constants and thicknesses. The results show that the complex relative permittivity of the samples matches the measured and calculated values of S-parameters in the frequency range of 8.2GHz to 12.4GHz.

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Section: Introductionmentioning

confidence: 99%

Accurate Estimation without Calibration of the Complex Relative Permittivity of Multilayer Dielectric Material based on the Finite Integration Technique

2023

Eng. Technol. Appl. Sci. Res.

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A Measurement of Non-Coaxial RF Devices with Improved TRL Calibration Algorithm

Chen

Wang

et al. 2018

MATEC Web Conf.

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In order to test the S-parameters of non-coaxial RF (Radio Frequency) devices accurately, using ADS (Advanced Design System) to simulate and design a set of fixture and calibration pieces for noncoaxial RF device performance test, and the calibration pieces is used to calibrate the test fixture, remove the error introduced by the fixture, and obtain the real S parameters of non-coaxial RF microwave devices. Based on the study of various parameters of RF microwave devices, the Engen's TRL (Thru-Reflect-Line) calibration algorithm is studied in depth. An improved TRL calibration algorithm is proposed. And the use of MATLAB program to achieve two calibration algorithms to correct the system error introduced by the measuring fixture, so as to get the real performance parameters of the device under test. Through the test of the verification device, the agreement between the improved TRL algorithm and Engen's TRL algorithm is verified. The final design of the test fixture can be successfully applied to the network analyzer for noncoaxial RF devices S-parameter measurement.

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