2017
DOI: 10.1088/1748-0221/12/04/p04009
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A new spectroscopic imager for X-rays from 0.5 keV to 150 keV combining a pnCCD and a columnar CsI(Tl) scintillator

Abstract: By combining a low noise fully depleted pnCCD detector with a columnar CsI(Tl) scintillator an energy dispersive spatial resolving detector can be realized with a high quantum efficiency in the range from below 0.5 keV to above 150 keV. The used scintillator system increases the pulse height of gamma-rays converted in the CsI(Tl), due to focusing properties of the columnar scintillator structure by reducing the event size in indirect detection mode (conversion in the scintillator). In case of direct detection … Show more

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Cited by 5 publications
(6 citation statements)
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“…Comparing the two detection processes of pnCCD and CsI(Tl) we can conclude that (a) 273 signal electrons per keV photon energy deposited in the silicon of the pnCCD are delivered while (b) we get 51 (experimental value in this work is 47) electrons per keV from the CsI signal, at the same incident energy. The direct conversion in the Silicon leads to a 5.4 (experimental value in this work is 5.8) times higher output signal compared to the indirect signal from the CsI [3]. But the very important difference between the two detection schemes for our application in crystallography is the 50% quantum efficiency at 100 keV of the CsI(Tl) compared to less than 1% for silicon.…”
Section: The Detection Process Of X-rays In Silicon and Csi(tl)mentioning
confidence: 70%
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“…Comparing the two detection processes of pnCCD and CsI(Tl) we can conclude that (a) 273 signal electrons per keV photon energy deposited in the silicon of the pnCCD are delivered while (b) we get 51 (experimental value in this work is 47) electrons per keV from the CsI signal, at the same incident energy. The direct conversion in the Silicon leads to a 5.4 (experimental value in this work is 5.8) times higher output signal compared to the indirect signal from the CsI [3]. But the very important difference between the two detection schemes for our application in crystallography is the 50% quantum efficiency at 100 keV of the CsI(Tl) compared to less than 1% for silicon.…”
Section: The Detection Process Of X-rays In Silicon and Csi(tl)mentioning
confidence: 70%
“…A novel X-ray imaging system has been developed recently by PNSensor GmbH in Munich. It is based on a combination of a micro-columnar Thallium doped Cesium Iodide (CsI(Tl)) scintillator with a silicon pnCCD detector [3]. CsI scintillators doped with Thallium (Tl) has a high stopping power for γ-rays compared to Si and Ge due to its high mass density of 4.5 g/cm 3 and high atomic number of Z Cs = 55 -1 - and Z I = 53.…”
Section: Spectroscopic Imaging Of Hard X-raysmentioning
confidence: 99%
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“…When CsI is separated by columnar crystals and light having an angle that does not satisfy the total reflection condition is incident on the boundary, the light is transmitted to the adjacent columnar crystal. (17) The light does not affect adjacent pixels in the collimator because the silicon does not permit the transmission of visible light. The absorption of visible light by silicon does not affect the MTF because the MTF does not depend on the light intensity.…”
Section: Spatial Resolution Of Silicon Collimatormentioning
confidence: 99%