“…The existing techniques are typically based on various transmission/reflection measurements, either in the frequency domain, or in time domain, in transmission lines, cavities, open space, or using special probes terminated with material samples under test. The literature is replete with various measurement techniques (Nicholson & Ross, 1970;Fellner-Feldegg, 1972;Weir, 1974;BakerJarvis, et al, 1993BakerJarvis, et al, , 2001Musil & Zacek, 1986;Ghodgaonkar et al, 1990;Zheng & Smith, 1991;Ganchev et al, 1995;Jargon & Janezic, 1996;Wang et al, 1998;Roussy et al 2004;Ledieu & Acher, 2003;Bekker et al, 2004). For practical EMC purposes, it is convenient to have systematic methodology to help EMC engineers to design and evaluate effectiveness of EMI noise-suppressing materials and structures based on their measured dielectric and magnetic responses.…”