2004
DOI: 10.1016/j.jmmm.2003.08.033
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A new strip line broad-band measurement evaluation for determining the complex permeability of thin ferromagnetic films

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Cited by 167 publications
(70 citation statements)
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“…The frequencydependent complex permeability of the films was measured in the frequency range f ¼ 0.03..5 GHz by using a strip-line permeameter connected to an Agilent 8719D vector network analyzer. [14] Results Thin Film Growth, Constitution, and Microstructure…”
Section: Characterization Of the Macroscopic Mechanical And Magnetic mentioning
confidence: 99%
“…The frequencydependent complex permeability of the films was measured in the frequency range f ¼ 0.03..5 GHz by using a strip-line permeameter connected to an Agilent 8719D vector network analyzer. [14] Results Thin Film Growth, Constitution, and Microstructure…”
Section: Characterization Of the Macroscopic Mechanical And Magnetic mentioning
confidence: 99%
“…One is the method using a microwave cavity where the FMR line width is measured by sweeping the magnetic filed at a fixed frequency [3,4]. The other is the method employing a vector network analyser (VNA) where the frequency is swept under a fixed magnetic field [5][6][7]. Dynamic magnetic properties at arbitrary magnetization states of a sample are important for the actual devices which operate under various magnetic fields [8].…”
Section: Introductionmentioning
confidence: 99%
“…Different methods of characterization of dielectric materials are summarized in (Von Hippel, 1995;Chen, 2004), and various approaches to extract parameters of ferrite materials over different frequency ranges are described in (Polder, 1950;Rado, 1953;Mullen & Carlson, 1956;Lax & Button, 1963;Korolev et al, 2008). Currently there are numerous automated methods for wideband characterization of dielectric and magnetic bulk materials (Nicholson & Ross, 1970;Weir, 1974;Barry, 1986), as well as of thin films (Bekker et al, 2004;Booth et al, 1994). The existing techniques are typically based on various transmission/reflection measurements, either in the frequency domain, or in time domain, in transmission lines, cavities, open space, or using special probes terminated with material samples under test.…”
Section: Introductionmentioning
confidence: 99%
“…The existing techniques are typically based on various transmission/reflection measurements, either in the frequency domain, or in time domain, in transmission lines, cavities, open space, or using special probes terminated with material samples under test. The literature is replete with various measurement techniques (Nicholson & Ross, 1970;Fellner-Feldegg, 1972;Weir, 1974;BakerJarvis, et al, 1993BakerJarvis, et al, , 2001Musil & Zacek, 1986;Ghodgaonkar et al, 1990;Zheng & Smith, 1991;Ganchev et al, 1995;Jargon & Janezic, 1996;Wang et al, 1998;Roussy et al 2004;Ledieu & Acher, 2003;Bekker et al, 2004). For practical EMC purposes, it is convenient to have systematic methodology to help EMC engineers to design and evaluate effectiveness of EMI noise-suppressing materials and structures based on their measured dielectric and magnetic responses.…”
Section: Introductionmentioning
confidence: 99%