A new technique of characterization of intrapixel response dedicated to astronomical detectors

Ketchazo, Christian; Viale, T.; Boulade, O.; Druart, Guillaume; Moreau, Vincent; Mugnier, Laurent M.; Dubrueil, D.; Derelle, Sophie; Ronayette, S.; Guérineau, Nicolas

doi:10.1016/j.nima.2014.12.048

Cited by 3 publications

(2 citation statements)

References 9 publications

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“…The optical system of this method is very complex; therefore, the continuously self-imaging grating (CSIG) method has been applied. The CSIG method consists of the sampling of the pixel transfer function by projecting high-resolution periodic patterns without classic optics but using the CSIG illuminated by a plane wave, and the IPS is determined by inverse Fourier transform [9,10]. Although the CSIG method does not require a complex optical system, it can only characterize the average IPS of all pixels in the photodetector array, and the accuracy of IPS characterization for the CSIG method is not high because it cannot consider the physical principle of IPS.…”

Section: Introductionmentioning

confidence: 99%

Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Zhong

Zhu

et al. 2021

Sensors

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The high-precision characterization of the intra-pixel sensitivity (IPS) for infrared focal plane array (FPA) photodetector is of great significance to high-precision photometry and astrometry in astronomy, as well as target tracking in under-sampled remote sensing images. The discrete sub-pixel response (DSPR) model and fill factor model have been used for IPS characterization in some studies. However, these models are incomplete and lack the description of physical process of charge diffusion and capacitance coupling, leading to the inaccuracy of IPS characterization. In this paper, we propose an improved IPS characterization method based on the diffusion and coupling physical (DCP) model for infrared FPA photodetector, which considering the processes of generation and collection of the charge, can improve the accuracy of IPS characterization. The IPS model can be obtained by convolving the ideal rectangular response function with the charge diffusion function and the capacitive coupling function. Then, the IPS model is convolved with the beam spot profile to obtain the beam spot scanning response model. Finally, we calculate the parameters of IPS by fitting the beam spot scanning response map with the proposed DCP model based on the Trust-Region-Reflective algorithm. Simulated results show that when using a 3 μm beam spot to scan, the error of IPS characterization based on DCP model is 0.63%, which is better than that of DSPR model’s 3.70%. Experimental results show that the fitting error of the beam spot scan response model based on DCP model is 4.29%, which is better than that of DSPR model’s 8.31%.

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Section: Introductionmentioning

confidence: 99%

Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Zhong

Zhu

et al. 2021

Sensors

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“…However this technique allows one to obtain a MTF (then PSF or LSF) of an average pixel corresponding to an area of the detector. Ketchazo et al [6] presented an adaptation of this technique for the characterization of the intrapixel response of each pixel of a detector. The idea is to couple the projection of the interferograms made of sub-pixel details with a precise micro-scanning process.…”

Section: Introductionmentioning

confidence: 99%

Intrapixel measurement techniques on large focal plane arrays for astronomical applications: a comparative study

Ketchazo

Viale

Boulade

et al. 2017

International Conference on Space Optics — ICSO 2016

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A method for the characterization of intra-pixel response of infrared sensor

et al. 2019

Opt Quant Electron

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A new technique of characterization of intrapixel response dedicated to astronomical detectors

Cited by 3 publications

References 9 publications

Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Intrapixel measurement techniques on large focal plane arrays for astronomical applications: a comparative study

A method for the characterization of intra-pixel response of infrared sensor

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