A new test set compression scheme for circular scan

Zhang, Ling; Mei, Junjin; Bowu, Yan

doi:10.1186/s13639-018-0085-2

Cited by 6 publications

(3 citation statements)

References 16 publications

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“…But, this architecture suffers from the area overhead and routing congestion. The various broadcast-based scan compression architectures have been proposed in [5,15,[17][18][19][20][21][22][28][29][30][31][32][33][34][35][36].…”

Section: Broadcast-based Scan Compression Architecturementioning

confidence: 99%

New scan compression approach to reduce the test data volume

Shantagiri

Kapur

Shastry

2021

IET Computers & Digital Tech

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The test data volume (TDV) increases with increased target compression in scan compression and adds to the test cost. Increased TDV is the result of a dependency across scan flip‐flops (SFFs) that resulted from compression architecture, which is absent in scan mode. The SFFs have uncompressible values logic‐0 and logic‐1 in many or most of the patterns contribute to the TDV. In the proposed new scan compression (NSC) architecture, SFFs are analysed from Automatic Test Pattern Generation (ATPG) patterns generated in a scan mode. The identification of SFFs to be moved out of the compression architecture is carried out based on the NSC. The method includes a ranking of SFFs based on the specified values present in the test patterns. The SFFs having higher specified values are moved out of the compression architecture and placed in the outside scan chain. The NSC is the combination of scan compression and scan mode. This method decides the percentage (%) of SFFs to be moved out of compression architecture and is less than 0.5% of the total SFFs present in the design to achieve a better result. The NSC reduces dependencies across the SFFs present in the test compression architecture. It reduces the TDV and test application time. The results show a significant reduction in the TDV up to 78.14% for the same test coverage.

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Section: Broadcast-based Scan Compression Architecturementioning

confidence: 99%

New scan compression approach to reduce the test data volume

Shantagiri

Kapur

Shastry

2021

IET Computers & Digital Tech

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“…In the literature, there exist numerous schemes to control TDV as well as TAT through improved CR. In which, built-in self-test (BIST) strategies [14,18,24] are very useful for controlling the TDV and reducing TAT. So, several test compaction methods [14] possess the capability to control the test data volume in a great extent.…”

Section: Introductionmentioning

confidence: 99%

“…The complex circuits greatly suffer from the problem of large test data volume during testing. However, an increase in density and need for testing a novel categories of circuit faults on nanometer technology cause huge enlarge under TD Vas well as TAT [24]. Some recent research related to the presented work is reviewed in this section:…”

Section: Introductionmentioning

confidence: 99%

On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization

et al. 2021

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In this manuscript, a novel test data compression (TDC) system is proposes for reducing a test data volume (TDV) for circular scan (CS) architecture. A modified version of meta-heuristic population based optimization approach, hence it is called shuffled shepherd optimization (SSO) and it is used to optimize the conflicting bit minimization (CBM) problem. In CS framework, TDC is reached by upgrading only the conflicting bits among template pattern, real test pattern. Reduced test data volume and test application time are achieved by diminishing the Hamming distance between the currently captured response and the subsequent test vector. The CBM issue is formulated by a traveling salesman problem (TSP). Here, the test vectors are assumed by cities, the HD among test vectors a pair is assumed by distance of interurban. A modified version of the SSO algorithm called as MSSO is applied in combination using mutation operator for solving the issue of CBM. Experimental outcomes display the proposed TDC method using MSSO achieves an average development of 8.36% in compression ratio (CR) as well as 6.77% in TAT is attained by reducing a TDV. This proposed approach outperforms other state-of-art test data compression schemes by providing improved CR, TAT reduction and TDV reduction.

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An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic

Mitra

Das

2020

J Electron Test

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A new test set compression scheme for circular scan

Cited by 6 publications

References 16 publications

New scan compression approach to reduce the test data volume

New scan compression approach to reduce the test data volume

On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization

An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic

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