2017
DOI: 10.1109/jssc.2017.2732731
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A Non-Interleaved 12-b 330-MS/s Pipelined-SAR ADC With PVT-Stabilized Dynamic Amplifier Achieving Sub-1-dB SNDR Variation

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Cited by 72 publications
(28 citation statements)
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“…It reduces to 250pS at VDD=720mV, temp. =0°C, SS process corner [14][15][16][17][18][19][20][21][22][23][24][25][26]. 790 simulation of maximum worst case condition, the average power consumption of proposed comparator is 77nW which is 87% lower than Paik's comparator and 73% lower than Schinkel's comparator.…”
Section: Functional Simulationmentioning
confidence: 99%
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“…It reduces to 250pS at VDD=720mV, temp. =0°C, SS process corner [14][15][16][17][18][19][20][21][22][23][24][25][26]. 790 simulation of maximum worst case condition, the average power consumption of proposed comparator is 77nW which is 87% lower than Paik's comparator and 73% lower than Schinkel's comparator.…”
Section: Functional Simulationmentioning
confidence: 99%
“…To ensure the robustness of a design, process corner simulation is required at the design stage. Process corner represents the extremes parameter variation of integrated circuit design which is fabricated on semiconductor wafer [6][7][8][9][10][11][12][13][14][15]. Parameter variations include range of process transistor properties, supply voltages and die temperatures [8,9].…”
Section: Introductionmentioning
confidence: 99%
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“…A major design bottleneck is that the compromise between faster settling speed and power consumption reduction. Numerous ways to either enhance the class AB operation of the OTA or to make its bias current signal time-dependent can be found in the literature [1][2][3][4][5][6]. Dominantly they affect the internal design and dimensioning of the OTA itself.…”
Section: Introductionmentioning
confidence: 99%