2014
DOI: 10.1007/s11801-014-4060-4
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A non-polarization short-wave-pass thin film edge filter

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Cited by 5 publications
(3 citation statements)
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“…The typical stack of the short-wave-pass thin film edge filter based on the thin film optics theory, is (0.5L H 0.5L)^P where P is the number of cycles coatings, H and L represent the optical thicknesses of λ 0 / 4 of the high refractive index and low refractive index film layers 14 , and λ 0 is the center wavelength under normal incidence. The optical film thickness is expressed as the product of the refractivity n and the physical thickness d (n × d) of the high refractivity material and low refractivity material, and the optical film thickness λo/4 at the center wavelength λo is normally shown as 1.…”
Section: Results and Discusionmentioning
confidence: 99%
“…The typical stack of the short-wave-pass thin film edge filter based on the thin film optics theory, is (0.5L H 0.5L)^P where P is the number of cycles coatings, H and L represent the optical thicknesses of λ 0 / 4 of the high refractive index and low refractive index film layers 14 , and λ 0 is the center wavelength under normal incidence. The optical film thickness is expressed as the product of the refractivity n and the physical thickness d (n × d) of the high refractivity material and low refractivity material, and the optical film thickness λo/4 at the center wavelength λo is normally shown as 1.…”
Section: Results and Discusionmentioning
confidence: 99%
“…SWP edge filters pass the shorter wavelengths of the spectrum while blocking the longer wavelengths, and LWP edge filters do the opposite. The designs of edge filters are as follows [25].…”
Section: Introductionmentioning
confidence: 99%
“…One design has the passband on the high wavelength side of the stop band, while the other one is on the low wavelengths side. The designs of the edge filters are the following 13 Where H and L are quarter-wave optical thickness of a high index layer and a low index layer respectively. The double-layer combination (HL) stack between massive substrate (nS) and air (nO) is repeated A times.…”
Section: Introductionmentioning
confidence: 99%