Proceedings of 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)
DOI: 10.1109/stherm.1995.512044
|View full text |Cite
|
Sign up to set email alerts
|

A novel approach for the thermal characterization of electronic parts

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
22
0

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 85 publications
(22 citation statements)
references
References 7 publications
0
22
0
Order By: Relevance
“…CTMs have been successfully employed in the analysis and development of electronic components where the conductivity of the materials was unknown. The DELPHI team [5,6] developed a formal procedure to generate CTMs which were Boundary Condition Independent. In this way the CTMs were reproducing the object behaviour under "any" boundary condition applied and could be used as a black box.…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
“…CTMs have been successfully employed in the analysis and development of electronic components where the conductivity of the materials was unknown. The DELPHI team [5,6] developed a formal procedure to generate CTMs which were Boundary Condition Independent. In this way the CTMs were reproducing the object behaviour under "any" boundary condition applied and could be used as a black box.…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
“…There have been abundant existing compact thermal modeling methods in the literature. For example, the authors of [4] [5] [9] propose the DELPHI approach and introduce the important concept of boundary condition independence (BCI). The DELPHI approach extracts and optimizes a thermal resistance network from detailed model simulations under a set of standard boundary conditions.…”
Section: ) Computational Speedmentioning
confidence: 99%
“…Surface-to-surface resistors were added to the improved star-shaped network for representing the realistic characterisation of heat transfer in a better manner. In all of the 38 kinds of different conditions mentioned in [9], the improved model can predict the junction temperature accurately; the error is only 1 -2%.…”
Section: Introductionmentioning
confidence: 98%
“…The network topology is star-shaped and only under isothermal condition can it predict the junction temperature accurately. Rosten et al [7] and Lasance et al [8,9] established an improved star-shaped compact thermal resistance network model that was boundary condition independent. Surface-to-surface resistors were added to the improved star-shaped network for representing the realistic characterisation of heat transfer in a better manner.…”
Section: Introductionmentioning
confidence: 99%