2011 3rd International Conference on Electronics Computer Technology 2011
DOI: 10.1109/icectech.2011.5941581
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A novel approach of test case generation for concurrent systems using UML Sequence Diagram

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Cited by 36 publications
(35 citation statements)
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“…Generating test paths from Unified Modeling Language (UML) diagrams help developers to reduce their efforts for learning new specifications so much because it is a mainstream technique in software development [1]. On the other hand, UML diagrams that are made in the design phase are useful sources for white box test case generation [3][4][5][6][7]. However source code is the most common artifact for test case generation in white box approach.…”
Section: Introductionmentioning
confidence: 99%
“…Generating test paths from Unified Modeling Language (UML) diagrams help developers to reduce their efforts for learning new specifications so much because it is a mainstream technique in software development [1]. On the other hand, UML diagrams that are made in the design phase are useful sources for white box test case generation [3][4][5][6][7]. However source code is the most common artifact for test case generation in white box approach.…”
Section: Introductionmentioning
confidence: 99%
“…In this paper, BCO algorithm is designed for maximum fault coverage with the generation of test cases in less time. Khandai et al [16] described a technique that generates the test cases from UML combinational diagrams like sequence diagram and activity diagram. An activity diagram is converted into activity graph by applying the criteria of path coverage.…”
Section: Related Workmentioning
confidence: 99%
“…SUN ET AL. [32] No No No [33] Yes No No [34] Yes Yes No [35,36] No Yes No [38] No Yes No [39] Yes No No [41] No No No [42] No No No Our approach…”
mentioning
confidence: 99%