A Novel BIST Circuit for Testing and Analysis Parametric Faults in PLL

Toihria, Intissar; Ayadi, Rim; Masmoudi, Mohamed

doi:10.15866/iree.v10i2.5089

Cited by 1 publication

(3 citation statements)

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“…In the latter, we compare the results of the proposed modified BIST and those obtained in previous work [12]. The proposed on-chip BIST scheme shows fault coverage of 100% for catastrophic faults and process variations for the PLL.…”

Section: ) Discharge Test Modementioning

confidence: 87%

“…In our preceding work [12], three multiplexors and two delay cells are used. In order to further reduce the area occupied by the test circuit, we propose a new test stimulus generator circuit as shown in Fig.…”

Section: B Test Stimulus Generator Circuitmentioning

confidence: 99%

“…The selection circuit used herein is very simple with a small number of components as presented in Fig. 4 (compared to the three multiplexers used in the preceding work [12] and to recent test stimulus generator circuit [12]. It is composed of two selection subcircuits.…”

Section: B Test Stimulus Generator Circuitmentioning

confidence: 99%

See 2 more Smart Citations

Fault coverage analysis of selection circuit based BIST for RF CP-PLL

Ayadi¹,

Intisssar²,

Mohamedr³

2016

2016 13th International Multi-Conference on Systems, Signals &Amp; Devices (SSD)

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Analog and mixed-signal testing is becoming an important issue that affects both the time-to-market and the product cost of many SoCs. In order to provide an efficient testing method for 865-870 MHz Charge pump phase-locked loop (CP-PLL) which constitutes a mixed-signal circuit a novel BIST method is developed. This BIST can be easily implemented with a test stimulus generator circuit, all existing blocks in CP-PLL and fault evaluation circuit. In order to reduce the chip area overheard, this technique use a selection circuit and one delay cell. The simulation results of the novel technique show high fault coverage 100% like that of our previous testing methods. Thus, it provides an efficient structural test suitable for a production test in terms of an area overhead, a test accessibility, and test time.

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Section: ) Discharge Test Modementioning

confidence: 87%

Section: B Test Stimulus Generator Circuitmentioning

confidence: 99%