1998
DOI: 10.1109/22.681206
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A novel FET model including an illumination intensity parameter for simulation of optically controlled millimeter-wave oscillators

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Cited by 19 publications
(7 citation statements)
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“…Direct illumination is carried out from the top of the device using a semiconductor laser with λ = 820 nm and a spot diameter of 10 µm. Figure 2 shows representative I-V curves for the dark and illuminated device for V gs = 0.2 V. These curves are compared to experimental data as well as values obtained using the equivalent circuit model presented in Kawasaki et al (1998). The figure shows that the I-V characteristics obtained by the various approaches are in a close agreement.…”
Section: Results and Analysismentioning
confidence: 57%
See 1 more Smart Citation
“…Direct illumination is carried out from the top of the device using a semiconductor laser with λ = 820 nm and a spot diameter of 10 µm. Figure 2 shows representative I-V curves for the dark and illuminated device for V gs = 0.2 V. These curves are compared to experimental data as well as values obtained using the equivalent circuit model presented in Kawasaki et al (1998). The figure shows that the I-V characteristics obtained by the various approaches are in a close agreement.…”
Section: Results and Analysismentioning
confidence: 57%
“…The experimental set-up is similar to that used in Kawasaki et al (1998). Figure 1 shows the structure of the GaAs-based device under study.…”
Section: Results and Analysismentioning
confidence: 99%
“…Since the MMIC oscillator operates at 23.1 GHz as described above, the S parameters were measured under an applied bias by using a network analyzer and a database was created. In this way, the FET model parameters assuming the Statz model were extracted and were then entered into the circuit simulator of the entire AIA [12,13]. The simulation results are shown in Fig.…”
Section: Aia Arraymentioning
confidence: 99%
“…Calandra [3] has modeled the DC response and demonstrated the differences between light-induced effects and bias-shift-related ones, either direct or indirect. Kawasaki [4] has modeled the DC and RF responses, including new elements in the equivalent circuit which are functions of optical power, for the simulation of the optical characteristics of microwave and millimeter-wave integrated circuits. Our group has shown the importance of nonlinear characteriza-tion of transistors from pulsed measurements, with [5] and without laser illumination [6].…”
Section: Introductionmentioning
confidence: 99%