A Novel Method for Automatically Extracting Breakdown Voltage of Zener Diodes from I-V Characteristics Curves

Liang, Yingzong; Zhang, Dongrong; Chen, Yanning; Zhao, Dongyan; Shao, Yali; Wang, Kai

doi:10.1109/iseda59274.2023.10218469

2023 International Symposium of Electronics Design Automation (ISEDA) 2023

DOI: 10.1109/iseda59274.2023.10218469

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A Novel Method for Automatically Extracting Breakdown Voltage of Zener Diodes from I-V Characteristics Curves

Yingzong Liang,

Dongrong Zhang,

Yanning Chen

et al.

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2024

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Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

van Niekerk,

Venter

2024

Electronics

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This study investigated the reliability of Zener diodes subjected to a gradually increasing DC switching surge amplitude with delay internals between surges to avoid thermal degradation from different manufacturers with similar specifications. The analysis involved applying occasional 3 ms direct current (DC) switching surges with a gradual increasing surge voltage, followed by a constant current test to verify device functionality for three different selected manufacturer 5.1 V Zener diodes. This experimental approach was used to identify the maximum surge current that each Zener diode could handle before failing to clamp the surge voltage at the specified Zener reference voltage. Statistical analysis revealed significant differences in the maximum average surge current between different manufacturers. The maximum average surge current findings just before failure were 1.98 A, 3.18 A, and 3.33 A, respectively, and associated 95% confidence interval ranges can be used as a reliable metric to compare Zener diode population reliability against occasional DC switching surges. The findings revealed variations in the DC switching surge current handling capabilities between Zener diodes from different manufacturers with similar electrical specifications. The statistically measured maximum average surge current just before device failure can be considered an effective metric to compare the reliability of Zener diodes against DC switching surge degradation.

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Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

van Niekerk,

Venter

2024

Electronics

View full text Add to dashboard Cite

show abstract

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A Novel Method for Automatically Extracting Breakdown Voltage of Zener Diodes from I-V Characteristics Curves

Cited by 1 publication

References 9 publications

Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

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