A novel self-healing methodology for RF Amplifier circuits based on oscillation principles

Goyal,; Swaminathan,

doi:10.1109/date.2009.5090929

Cited by 19 publications

(9 citation statements)

References 2 publications

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“…Furthermore, in order to calibrate output match variation, the range of Cd must be between 100fF and 1 pF. As diodes and MOS varactors have high minimum capacitances (400fF), they are not suitable for use in a switchable capacitance bank [2,6]. In addition, Ld can be used for output match tuning, as described in [3].…”

Section: Compensation Of Output Match S22 and Reverse Isolation S12mentioning

confidence: 98%

“…However, this method has some disadvantages; such as difficulty in simulating the inductance variation from the number of spirals inductor turns [2], and added switch resistor noise resulting in gain decrease. Nevertheless, we can deliberately use a new LNA variable to calibrate S22 and S12 without adding a new component [2,6] that allows degradation of LNA performances. Of the tunable variables in Low noise amplifier LNA, Rref is used to tune the S22 and S12.…”

Section: Compensation Of Output Match S22 and Reverse Isolation S12mentioning

confidence: 99%

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Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor

Ayadi¹,

Mahresi

Masmoudi³

2012

J Electron Test

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With recent advances in CMOS process technology, the concept of system-on-a-chip (SoC) has been realized by integrating more and more digital and analog building blocks in a single chip [2,9]. Additionally, these advances have brought several new types of processes faults (soft fault) and higher process variations to RF circuit resulting performances degradation. In order to compensate the RF circuit performance, a novel efficient self-calibration method for 865-870 MHz low noise amplifiers (LNAs), which constitute a RF mixed-signal circuit, is developed. This technique detects any deviation from the output match and from reverse isolation using built-in self test (BIST) methods, and then provides a corrective measure to recalibrate these LNA performances to the possible optimal value. This proposed self-calibration technique uses a switchable resistor which has been designed to investigate its ability to compensate for output match S22 and reverse isolation S12 without affecting other LNA performances. The use of this method saves space on chip and prevents adding switch resistor noise.In addition, the new calibration design shows the ability to calibrate S22 and S12 due to the catastrophic fault.

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Section: Compensation Of Output Match S22 and Reverse Isolation S12mentioning

confidence: 98%

Section: Compensation Of Output Match S22 and Reverse Isolation S12mentioning

confidence: 99%

Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor

Ayadi¹,

Mahresi

Masmoudi³

2012

J Electron Test

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“…Post-silicon repair of memory using redundant rows/columns is a classical example of such in-built healing systems. Several other post-silicon healing techniques that tolerate parameter variations are described in [3][4][5][6][7], [12]. These approaches either incorporate built-in redundancy in the system or modify the supply voltage, bias voltage or operating frequency for the system.…”

Section: Introductionmentioning

confidence: 99%

“…These approaches either incorporate built-in redundancy in the system or modify the supply voltage, bias voltage or operating frequency for the system. However, most of these explorations target healing a single core such as a microprocessor [4,5], signal processing module, embedded memory [6,7] or RF circuits [12], while efficient self-healing approach in large complex SoCs comprising of multiple heterogeneous cores remains largely unexplored. Some preliminary work is presented in [10][11].…”

Section: Introductionmentioning

confidence: 99%

System level self-healing for parametric yield and reliability improvement under power bound

Narasimhan

Sauseng

Chakraborty

et al. 2010

2010 NASA/ESA Conference on Adaptive Hardware and Systems

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Post-silicon process compensation or "healing" of integrated circuits (ICs) has emerged as an effective approach to improve yield and reliability under parameter variations. In a System-on-Chip (SoC) comprising of multiple cores, different cores can experience different process shift due to local within-die variations. Furthermore, the cores are likely to have different sensitivities with respect to system power dissipation and system output parameters such as quality of service or throughput. Post-silicon healing has been addressed earlier at core level using various compensation approaches. In this paper, we present a system level healing algorithm for compensating SoC chips for a specific output parameter under power constraint. We formulate the healing problem as an ordinal optimization problem, where individual cores need to be assigned the right amount of healing that satisfies the target system performance and power requirement. Next, we propose an efficient solution to the problem using a priori design-time information about the relative sensitivities of the cores to system performance and power. Simulation results for example systems show that the proposed healing approach can achieve higher parametric yield and better settling time compared to conventional healing approaches.

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“…As shown in Fig.1 in deep-submicron CMOS processes, RF circuits are expected to be increasingly prone to process variations, suffering from significant loss of parametric yield. Recently, calibration methods for embedded low noise amplifiers (LNAs) in RF systems have been proposed in [4][5][6]. In these methods, the embedded LNAs are tested and compensated for parametric defects using on-chip resources.…”

Section: Introductionmentioning

confidence: 99%

Self-Calibrating Embedded RF Down-Conversion Mixers

Goyal

Swaminathan

Chatterjee

2009

2009 Asian Test Symposium

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This paper proposes a self-calibrating approach for embedded RF down-conversion mixers. In the proposed approach, the output of the RF mixer is analyzed by using on-chip resources for testing and the mixer performs self-compensation for parametric defects using tuning knobs. The tuning knobs enable the RF mixer to self-calibrate for multi-parameter variations induced due to process variability. Using this methodology, it is demonstrated that performance compensation of RF downconversion mixers can be performed simultaneously for critical specifications such as Gain and 1-dB compression point (P1dB).

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A novel self-healing methodology for RF Amplifier circuits based on oscillation principles

Cited by 19 publications

References 2 publications

Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor

Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor

System level self-healing for parametric yield and reliability improvement under power bound

Self-Calibrating Embedded RF Down-Conversion Mixers

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