2015
DOI: 10.1016/j.mssp.2014.10.037
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A novel SOI-MESFET structure with double protruded region for RF and high voltage applications

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Cited by 24 publications
(1 citation statement)
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“…Doping engineering, work function engineering, voltage difference engineering, and many other techniques have all been proposed by many researchers to increase the efficiency of these type of devices. [17][18][19][20][21][22][23][24][25][26] It should be noted that all of the reported structures are usually configured in a double-gate (DG) form in order to increase the gate control over the channel. In fact, fabricating DG is one of the serious problems which can be considered as one of the important technical challenges.…”
mentioning
confidence: 99%
“…Doping engineering, work function engineering, voltage difference engineering, and many other techniques have all been proposed by many researchers to increase the efficiency of these type of devices. [17][18][19][20][21][22][23][24][25][26] It should be noted that all of the reported structures are usually configured in a double-gate (DG) form in order to increase the gate control over the channel. In fact, fabricating DG is one of the serious problems which can be considered as one of the important technical challenges.…”
mentioning
confidence: 99%