2013
DOI: 10.1039/c2sm26781k
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A novel technique for simultaneous velocity and interface profile measurements on micro-structured surfaces

Abstract: International audienceWe present a novel approach which allows simultaneous measurement of the velocity field and the interface profile close to a composite liquid-gas and solid-gas interface. The proposed scheme is the method of choice for the characterization of those flows where the velocity field is highly dependent on the actual shape and position assumed by liquid-gas and liquid-solid interfaces. The new method is based on the digital processing of microscopy images of a flow seeded with fluorescent pass… Show more

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Cited by 17 publications
(27 citation statements)
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“…A number of studies show that this is hardly strictly true also in simple systems [35,36,37,38]. However, the present results show that a detailed description of the surface pattern is not required unless the particle is very close to the wall.…”
Section: Resultscontrasting
confidence: 40%
“…A number of studies show that this is hardly strictly true also in simple systems [35,36,37,38]. However, the present results show that a detailed description of the surface pattern is not required unless the particle is very close to the wall.…”
Section: Resultscontrasting
confidence: 40%
“…3 shows the transverse profiles of the boundaries of the excluded volumes for both M1 and M2. As reported elsewhere, 32 the absolute position of the measured boundaries is accurate within a tracer diameter (namely, 0.3 μm), whose size is also shown in figure for comparison. The distance between the actual interfaces and the excluded volume boundary depends on the thickness of the tracer depletion layer.…”
Section: B Local Effective Slip Lengthmentioning
confidence: 76%
“…The number N of images per plane is chosen so that at the minimum detectable speed (about 30 μm/s) the Brownian motion component of tracer velocity is negligible (less than 1%) with respect to the average component. As a consequence of that, 32 we recorded N = 4000 frames at focal planes nearby the silicon surface and N = 3200 anywhere else.…”
Section: Velocity Measurementsmentioning
confidence: 99%
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