A novel two-axis parallel-kinematic high-speed piezoelectric scanner for atomic force microscopy

Alunda, Bernard Ouma; Lee, Yong Joong; Park, Soyeun

doi:10.3938/jkps.69.691

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High-speed Imaging1

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2020

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“…Fortunately, there have been many improvements in the imaging speeds of AFM, especially in the past decade. Several technological hurdles should be overcome to improve imaging speeds, and these include the slow data acquisition systems [ 235 , 236 ], low resonant frequency of the nano-positioners and scanners [ 234 , 237 , 238 ], low bandwidth of the feedback controller [ 234 , 237 ], and low resonant frequency of the microcantilevers [ 235 , 236 , 239 , 240 ]. An effective means to excite the microcantilevers in the MHz regime is also needed.…”

Section: High-speed Imagingmentioning

confidence: 99%

Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy

Alunda¹,

Lee

2020

Sensors

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This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review.

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