This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review.

The thermal conductivity (k) of poly(acrylic acid) (PAA) nanofibers, which were electrospun at various electrospinning voltages, was measured using suspended microdevices. While the thermal conductivities of the as-spun PAA nanofibers varied depending on the electrospinning voltages, the most pronounced 3.1-fold increase in thermal conductivity in comparison to that of bulk PAA was observed at the electrospinning voltage of 14 kV. On the other hand, a reduction in the thermal conductivity of the nanofibers was observed when the as-spun nanofibers were either thermally annealed at the glass transition temperature of PAA or thermally crosslinked. It is notable that the thermal conductivity of crosslinked PAA nanofibers was comparable to that of crosslinked bulk PAA. Polarized Raman spectroscopy and Fourier transform infrared spectroscopy verified that the k enhancement via electrospinning and the k reduction by the thermal treatments could be attributed to the conformational changes between gauche and trans states, which may be further related to the orientation of molecular chains. In contrast, hydrogen bonds did not contribute significantly to the k enhancement. Additionally, the suppression of k observed for the crosslinked PAA nanofibers might result from the shortening of single molecular chains via crosslinking.

A typical line-scan rate for a commercial atomic force microscope (AFM) is about 1 Hz. At such a rate, more than four minutes of scanning time is required to obtain an image of 256 ' 256 pixels. Despite control electronics of most commercial AFMs permit faster scan rates, default piezoelectric X-Y scanners limit the overall speed of the system. This is a direct consequence of manufacturers choosing a large scan range over the maximum operating speed for a X-Y scanner. Although some AFM manufacturers offer reduced-scan area scanners as an option, the speed improvement is not significant because such scanners do not have large enough reduction in the scan range and are mainly targeted to reducing the overall cost of the AFM systems. In this article, we present a simple parallel-kinematic substitute scanner for a commercial atomic force microscope to afford a higher scanning speed with no other hardware or software upgrade to the original system. Although the scan area reduction is unavoidable, our modified commercial XE-70 AFM from Park Systems has achieved a line scan rate of over 50 Hz, more than 10 times faster than the original, unmodified system. Our flexure-guided X-Y scanner can be a simple drop-in replacement option for enhancing the speed of various aging atomic force microscopes.

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