2018 International Conference on Radiation Effects of Electronic Devices (ICREED) 2018
DOI: 10.1109/icreed.2018.8905107
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A Novel Universal Radiation-hardened FFT Chip Design

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(2 citation statements)
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“…TMR is widely used for anti-SEU design. The implementation consists of three identical memories storing the same data and a voter [2,3], as shown in Figure 2. The voter outputs the majority of the data from the three memories, so that when SEU occurs in one of the memories, the output remains valid.…”
Section: Tmrmentioning
confidence: 99%
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“…TMR is widely used for anti-SEU design. The implementation consists of three identical memories storing the same data and a voter [2,3], as shown in Figure 2. The voter outputs the majority of the data from the three memories, so that when SEU occurs in one of the memories, the output remains valid.…”
Section: Tmrmentioning
confidence: 99%
“…Error detection and correction (EDAC) technologies which can detect and correct errors in a certain degree are very popular in improving the reliability of memory devices. For the transmission of secure data between devices and its local memory, triple modular redundancy (TMR) is widely used for anti-SEU design, but its probabilistic error correction ability can cause cumulative error [2,3]. Another disadvantage of TMR is its large memory overhead (200%) [4].…”
Section: Introductionmentioning
confidence: 99%