A preliminary study of CdS for solar cells using combined TEM and cathodoluminescence

Mam, Keriya; Durose, K.; Halliday, D.P.; Szczerbakow, A.

doi:10.1016/j.tsf.2004.11.044

Cited by 2 publications

(1 citation statement)

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“…Additional Scanning transmission electron microscope (STEM) measurements on the same lamellae allow the comparison between emission properties and the morphology of one specimen. This method is thus far used for other material systems [10]- [12] but not for the characterization of CIGSe absorber layers.…”

Section: Introductionmentioning

confidence: 99%

High lateral resolution energy dispersive X-ray spectroscopy and cathodoluminescence on lamellae of CIGSe solar cells

Schönherr

Tille

Schöppe

et al. 2014

2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)

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The spatial resolution of conventional measurement geometries for energy dispersive X-ray spectroscopy and cathodoluminescence is limited by the excitation volume. For Cu(In,Ga)Se 2 solar cells high acceleration voltages up to 30 kV are needed to excite the K-shell of the investigated elements. As a consequence, the expansion of the excitation volume is in the magnitude of the layer thickness. Hence, thin lamellae were prepared with a focused ion beam and thinned out to a specimen thickness down to 50 nm. As a result, the spatial resolution was increased up to 25 nm, because the excitation volume is limited by the thickness of the lamellae and in first approximation only depends on the diameter of the electron beam. Highly resolving EDS measurements were performed to determine the gallium profile in the Cu(In,Ga)Se 2 absorber and the expected behavior was verified. Furthermore, cathodoluminescence images were taken of the lamellae and the determined grain structure was compared with the structure measured via scanning transmission electron microscope.Index Terms -cathodoluminescence (CL), EDS, Cu(In,Ga)Se 2 (CIGS) , lamellae, photovoltaic, thin film solar cells.

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Section: Introductionmentioning

confidence: 99%