2012
DOI: 10.1108/02602281211257542
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A pressure mapping imaging device based on electrical impedance tomography of conductive fabrics

Abstract: PurposeElectrical impedance measurement and imaging are techniques that are widely used in a range of applications. Electro‐conductive knitted structure is a major new development in wearable computing. The purpose of this paper is to carry out a preliminary investigation of applying electrical impedance analysis to predict the behavior of electro‐conductive knitted structure. This can potentially pave the way for a low‐cost solution for pressure mapping imaging.Design/methodology/approachElectrical impedance … Show more

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Cited by 51 publications
(30 citation statements)
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“…The multiplexer 1 supplies excitation current to the electrodes and multiplexer 2 acquires voltage measurements. This is a simple EIT design with an SNR of 40 dB [1]. …”
Section: Resultsmentioning
confidence: 99%
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“…The multiplexer 1 supplies excitation current to the electrodes and multiplexer 2 acquires voltage measurements. This is a simple EIT design with an SNR of 40 dB [1]. …”
Section: Resultsmentioning
confidence: 99%
“…Time difference EIT technique can be used to image conductivity changes in a fabric sensor [1]. When pressure is applied to the fabric patch (the boundary is kept in a frame to maintain a fixed boundary and electrode position), the conductivity of the proposed conductive fabric changes with increasing pressure or deformation of the fabric.…”
Section: Introductionmentioning
confidence: 99%
“…In all of these applications, Electrical Impedance Tomography has been used to localise areas of inhomogeneity within the domain caused by the presence of elements that change the domain conductivity. If applied to a stretchable conductive substrate (as in [13,14,15,16,17]), the technique can be used to develop a flexible sensor with arbitrary size and shape that does not suffer from the presence of wires within the sensing area. Even if it sounds promising, the technique has some drawbacks, especially related to spatial resolution.…”
Section: Introductionmentioning
confidence: 99%
“…Electrical measurements have recently been used to monitor the pressure-induced surface deformation of conductive membranes. In particular, electrical impedance tomography (EIT) has been used to develop flexible pressure sensors [31,37,38], because it allows the electromechanical behavior of an electrically conducting film to be monitored. When a pressure-sensitive conductive sheet is exposed to pressure, the deformation of the surface alters the conductivity distribution, which can be detected by an EIT system.…”
mentioning
confidence: 99%