A Quasi-Analytical Model for Remote Field Eddy Current Inspection

Abstract

Abstract-The Remote Field Eddy Current (RFEC) method is widely used to inspect both ferrous and nonferrous metal tubes when internal access is the only possible way of inspection. An axisymmetric quasi-analytical model is presented in this paper in order to simulate the behavior of a RFEC system during its operation. The proposed model, based on the application of the Fourier Transform in space, is able to take into account the finite length of the excitation coil, fed by an AC current, and the relative movement between the RFEC system and the wall tube. Numerical simulations based on integral formulations and experimental measurements were used to validate the proposed quasi-analytical model.

Visualization of Eddy Current Distributions for Arbitrarily Shaped Coils Parallel to a Moving Conductor Slab

“…Therefore, theoretical analysis to clarify the ECD is strongly desired. The behavior of an eddy current strongly depends on factors such as coil shape, excitation frequency, conductor speed and conductor properties [5]. These complex dependencies have thus far prevented the development of a precise theoretical analysis of ECD.…”

Electromagnetic Characterization of Anisotropic and Weakly Conductive Materials by Using Resonant Circuits

“…In order to evaluate physical and geometrical properties or to detect and characterize defects in conductive materials, the eddy current nondestructive testing is widely used [1,2]. However, this method is less efficient for weakly conductive materials, such as carbon fiber reinforced polymers (CFRPs) [3][4][5].…”

Center and pseudo-isochronous conditions in a quasi analytic system

“…In fact, quasi-analytic systems have been widely used in modeling many practical problems in science and engineering recently. For example, an axis-symmetric quasi-analytical model was presented in order to simulate the behavior of a RFEC system during its operation [23]. A quasi-analytical model to predict and analyze signals on layered samples measured by infrared scattering type scanning near-field optical microscopy was modeled in [5].…”