A radiation-hardened programmable read only memory for space applications

Xie, Xiaodong; Zhang, Xiwen; Li, Wei; Du, Tao

doi:10.1587/elex.15.20180675

Cited by 2 publications

(1 citation statement)

References 10 publications

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“…In this aspect, it is of great significance to research on the radiation-resistant reinforcement of Buck. However, the existing research on radiation-hardened Buck is still limited to the analysis of Buck irradiation test and design of radiation devices [16,17,18,19,20,21,22,23,24], and the research on radiation-hard from circuit design is lacking. In this paper, a radiation-hard adaptive on-time generator is proposed by utilizing of leakage current compensation.…”

Section: Introductionmentioning

confidence: 99%

A radiation-hardened Buck converter

Yang

Luo

et al. 2019

IEICE Electron. Express

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Buck converter is widely used in the aerospace field. However, radiation in the aerospace environment will result in degradation or failure of devices and circuits. This paper presents a radiation-hard Buck, which is an adaptive on-time Buck. A radiation-hard adaptive on-time generator is proposed by utilizing of leakage current compensation. The proposed radiation-hard adaptive on-time generator is composed of an adaptive ontime timing block and a charging current generator. Finally, the proposed Buck is fabricated in a standard 0.18 µm BCD process. And the radiation tests show that the Buck still maintains stability after total ionizing dose irradiation at a total dose of 350 Krad (Si).

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Section: Introductionmentioning

confidence: 99%

A radiation-hardened Buck converter

Yang

Luo

et al. 2019

IEICE Electron. Express

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Characterization of Single Event Effect in a Radiation Hardened Programmable Read-Only Memory in a 130 nm Bulk CMOS Technology

Yang,

Zhang,

Zhang

et al. 2023

Journal of Nanoelectronics and Optoelectronics

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The concept of memory that can only be read but cannot be changed seems strange at first. In reality, it is found that it has great application potential, such as the processor with a fixed purpose, the initial set value of the microprocessor BIOS, and these data are stored in Programmable Read-Only Memory (PROM) to quickly realize system functions. The PROM storage content is fixed, greatly simplifying his design. The radiation of space particles is the main factor causing the failure of the electronic system of spacecraft. The PROM storage array of the space electronic system is the most basic guarantee for the normal operation of the electronic system. The chip adopts domestic 130 nm standard technology of Complementary Metal Oxide Semiconductor (CMOS), Muller-C digital filter is used in the peripheral subsystem of PROM storage array, and the core cell uses Dual Interlocked Cell (DICE) and ring gate and other radiation hardening technologies to design a 32Kx8bit radiation resistant asynchronous programmable PROM. Pre-silicon of devices was verified by Technology Computer Aided Design (TCAD), and post silicon radiation verification was completed through radiation experiment. The post silicon radiation experiment showed that the total ionizing Dose (TID) capacity of the PROM chip was ≥100 Krad (Si), the critical value of single event upset (SEU) was ≥37.1 MeV·cm2/mg, the critical value of single event latch up was ≥98 MeV·cm2/mg, meeting the life requirements of the initial value storage of aerospace electronic systems. These performances ensure the reliable operation of the space electronic system after restart.

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A radiation-hardened programmable read only memory for space applications

Cited by 2 publications

References 10 publications

A radiation-hardened Buck converter

A radiation-hardened Buck converter

Characterization of Single Event Effect in a Radiation Hardened Programmable Read-Only Memory in a 130 nm Bulk CMOS Technology

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