A review of external microbeams for ion beam analyses

Giuntini, L.

doi:10.1007/s00216-011-4889-3

Cited by 40 publications

(29 citation statements)

References 65 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…MeV-SIMS can be quantified with simultaneously acquired PIXE [10], and since it uses an MeV ion beam can also be used in atmosphere. External-beam IBA is widely used, and has recently been reviewed [11].…”

Section: Introductionmentioning

confidence: 99%

Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry

2012

View full text Add to dashboard Cite

Ion beam analysis (IBA) is a cluster of techniques including Rutherford and non-Rutherford backscattering spectrometry, and particle-induced X-ray emission (PIXE). Recently, the ability to treat multiple IBA techniques (including PIXE) self-consistently has been demonstrated. The utility of IBA for accurately depth profiling thin films is critically reviewed. As an important example of IBA, three laboratories have independently measured a silicon sample implanted with a fluence of nominally 5.1015As/cm2 at an unprecedented absolute accuracy. Using 1.5 MeV 4He+ Rutherford backscattering spectrometry (RBS), each lab has demonstrated a combined standard uncertainty around 1% (coverage factor k=1) traceable to an Sb-implanted certified reference material through the silicon electronic stopping power. The uncertainty budget shows that this accuracy is dominated by the knowledge of the electronic stopping, but that special care must also be taken to accurately determine the electronic gain of the detection system and other parameters. This RBS method is quite general and can be used routinely, to accurately validate ion implanter charge collection systems, to certify SIMS standards, and for other applications. The generality of application of such methods in IBA is emphasised: if RBS and PIXE data are analysed self-consistently then the resulting depth profile inherits the accuracy and depth resolution of RBS and the sensitivity and elemental discrimination of PIXE

show abstract

Section: Introductionmentioning

confidence: 99%

Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry

2012

View full text Add to dashboard Cite

show abstract

“…The samples have overlapping pigment particles and a cut through the pigments at the surface. All samples consist of linseed oil with a mean composition of C 18 H 31 O 2 and a mass density of 0.93 g/cm 3 (grey) and lead white 2PbCO 3 ·Pb(OH) 2 with a mass density of 6.14 g/cm 3 (white), see Table 1. Sample sizes used for the simulations were 4096x100 pixels with a pixel size of 500 nm, corresponding to sample sizes of 2048x50 µm 2 .…”

Section: Resultsmentioning

confidence: 99%

“…Typically an external beam of 2-3 MeV protons is used [3] and elastic backscattering spectroscopy (EBS), particle induced X-ray emission (PIXE) and particle induced -ray emission (PIGE) data are combined [4]. The measured spectra are being used for quantitative depth profiling of elements and for the determination of total amounts of trace elements [5].…”

Section: Introductionmentioning

confidence: 99%

“…However, as has been already demonstrated in [11] the analysis of backscattering spectra from heterogeneous multi-phase materials such as paint can get ambiguous and extracted depth profiles can get inaccurate if a multi-phase material with lateral distribution of materials is approximated to be laterally homogeneous: This approximation is only valid if the constituents 3 are sufficiently small but fails if the constituents get larger. This is a structural ambiguity and represents a potentially serious problem for the quantitative application of IBA methods to cultural heritage objects like paintings.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Computer simulation of backscattering spectra from paint

Mayer

Silva

2017

Nuclear Instruments and Methods in Physics Research Section B:

View full text Add to dashboard Cite

To study the role of lateral non-homogeneity on backscattering analysis of paintings, a simplified model of paint consisting of randomly distributed spherical pigment particles embedded in oil/binder has been developed. Backscattering spectra for lead white pigment particles in linseed oil have been calculated for 3 MeV H + at a scattering angle of 165° for pigment volume concentrations ranging from 30 vol.% to 70 vol.% using the program STRUCTNRA. For identical pigment volume concentrations the heights and shapes of the backscattering spectra depend on the diameter of the pigment particles: This is a structural ambiguity for identical mean atomic concentrations but different lateral arrangement of materials. Only for very small pigment particles the resulting spectra are close to spectra calculated supposing atomic mixing and assuming identical concentrations of all elements.Generally, a good fit can be achieved when evaluating spectra from structured materials assuming atomic mixing of all elements and laterally homogeneous depth distributions.However, the derived depth profiles are inaccurate by a factor of up to 3. The depth range affected by this structural ambiguity ranges from the surface to a depth of roughly 0.5 to 1 pigment particle diameters. Accurate quantitative evaluation of backscattering spectra from paintings therefore requires taking the correct microstructure of the paint layer into account.

show abstract

“…Standard IBA techniques are used to characterize the irradiated object. By raster-scanning the beam over the sample surface, a 2D or 3D distribution of elements can be determined with nm depth resolution and lateral resolution limited by the size of the beam spot, see Figure 2 [4,5,6].…”

Section: How Ion Beam Methods Workmentioning

confidence: 99%