A Review of Reliability Research on Nanotechnology

Jeng, Shuen-Lin; Lu, Jye‐Chyi; Wang, Kaibo

doi:10.1109/tr.2007.903188

Cited by 48 publications

(13 citation statements)

References 76 publications

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“…[39] The reliability of the SnO 2 nanocrystal-MWCNT sensor was investigated by comparing its original sensing performance with its behavior after a four-month storage period in a conventional capsule without extra precautions. As shown in Figure 3f, the sensor was still functioning well after four months, and its performance was only slightly degraded, suggesting its potential for long-term operations.…”

mentioning

confidence: 99%

Room‐Temperature Gas Sensing Based on Electron Transfer between Discrete Tin Oxide Nanocrystals and Multiwalled Carbon Nanotubes

2009

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mentioning

confidence: 99%

Room‐Temperature Gas Sensing Based on Electron Transfer between Discrete Tin Oxide Nanocrystals and Multiwalled Carbon Nanotubes

2009

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“…For example, Jeng et al presented a broad overview on the reliability research of nanotechnology and highlighted the importance of interconnect reliability [4]. Hu et al…”

Section: Introductionmentioning

confidence: 99%

Review of the Global Trend of Interconnect Reliability for Integrated Circuit

Lin¹,

Wu²,

Jia³

2018

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Interconnect reliability has been regarded as a discipline that must be seriously taken into account from the early design phase of integrated circuit (IC). In order to study the status and trend of the interconnect reliability, a comprehensive review of the published literatures is carried out. This can depict the global trend of ICs' interconnect reliability and help the new entrants to understand the present situation of this area.

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“…N RECENT years, the reduction of transistors size has allowed the increase of microprocessors speed and the decrease of their size and supply voltage, but at the cost of augmenting the incidence of faults [1], [2]. This reduction causes a higher rate of transient faults, commonly provoked by temporary environmental conditions (i.e.…”

Section: Introductionmentioning

confidence: 99%

Effects of Intermittent Faults on the Reliability of a Reduced Instruction Set Computing (RISC) Microprocessor

et al. 2014

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Gracia-Morán, J.; Baraza Calvo, JC.; Gil Tomás, DA.; Saiz-Adalid, L.; Gil, P. (2014 > REPLACE THIS LINE WITH YOUR PAPER IDENTIFICATION NUMBER (DOUBLE-CLICK HERE TO EDIT) < 1Abstract-With the scaling of CMOS technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining importance in modern VLSI circuits. The presence of these faults is increasing due to the complexity of manufacturing processes (which produce residues and parameter variations), together with special aging mechanisms. This work presents a case study of the impact of intermittent faults on the behavior of a RISC microprocessor. We have carried out an exhaustive reliability assessment by using VHDL-based fault injection. In this way, we have been able to modify different intermittent fault parameters, to select various targets, and even, to compare the impact of intermittent faults with those induced by transient and permanent faults.

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A Review of Reliability Research on Nanotechnology

Cited by 48 publications

References 76 publications

Room‐Temperature Gas Sensing Based on Electron Transfer between Discrete Tin Oxide Nanocrystals and Multiwalled Carbon Nanotubes

Room‐Temperature Gas Sensing Based on Electron Transfer between Discrete Tin Oxide Nanocrystals and Multiwalled Carbon Nanotubes

Review of the Global Trend of Interconnect Reliability for Integrated Circuit

Effects of Intermittent Faults on the Reliability of a Reduced Instruction Set Computing (RISC) Microprocessor

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