Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium
DOI: 10.1109/semthe.1988.10589
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A review of thermal characterization of power transistors

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Cited by 54 publications
(29 citation statements)
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“…Fig. 1 shows the typical circuit [15] for static calibration of the threshold voltage temperature dependence curve. The IGBT module was placed on the temperature-controlled board, thereby maintaining the referent temperature within the temperature range of interest.…”
Section: B Calibration Of Threshold Voltage Temperature Dependencementioning
confidence: 99%
“…Fig. 1 shows the typical circuit [15] for static calibration of the threshold voltage temperature dependence curve. The IGBT module was placed on the temperature-controlled board, thereby maintaining the referent temperature within the temperature range of interest.…”
Section: B Calibration Of Threshold Voltage Temperature Dependencementioning
confidence: 99%
“…Figure 7 shows basic circuit for threshold voltage measurement used for transient temperature response measurement [15], not for the measurement under real operating conditions. Only one switch is required, but in a very sensitive part of the circuit.…”
Section: Threshold Voltage Measurement Un-der Real Operating Conditionsmentioning
confidence: 99%
“…The single pulse response of the normalized transient thermal impedance (measurement [17] or manufacturer data sheet): r versus t constitutes the reference data. …”
Section: The Transistor Package (Chip-to-case)mentioning
confidence: 99%