2015
DOI: 10.1016/j.elspec.2015.06.006
|View full text |Cite
|
Sign up to set email alerts
|

A revisit to ultrathin NiO(001) film: LEED and valence band photoemission studies

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

3
3
0

Year Published

2015
2015
2021
2021

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 12 publications
(6 citation statements)
references
References 37 publications
3
3
0
Order By: Relevance
“…We observe a progressive increase in the intensities of Co 2p and O 1s with the increase of CoO coverages while the intensities of Ni 2p and Ag 3d show a decrease in intensities, as expected. The observed core level lineshapes, as well as their binding energies for the different core levels, are found to be in good agreement with that of stoichiometric NiO [46] and CoO [47] epitaxial ultrathin films for different film coverages. Moreover, the same instrumental setup, growth parameters, and procedures as earlier works [46,47], have been used to grow the present NiO and CoO films.…”
Section: Resultssupporting
confidence: 72%
See 3 more Smart Citations
“…We observe a progressive increase in the intensities of Co 2p and O 1s with the increase of CoO coverages while the intensities of Ni 2p and Ag 3d show a decrease in intensities, as expected. The observed core level lineshapes, as well as their binding energies for the different core levels, are found to be in good agreement with that of stoichiometric NiO [46] and CoO [47] epitaxial ultrathin films for different film coverages. Moreover, the same instrumental setup, growth parameters, and procedures as earlier works [46,47], have been used to grow the present NiO and CoO films.…”
Section: Resultssupporting
confidence: 72%
“…The observed core level lineshapes, as well as their binding energies for the different core levels, are found to be in good agreement with that of stoichiometric NiO [46] and CoO [47] epitaxial ultrathin films for different film coverages. Moreover, the same instrumental setup, growth parameters, and procedures as earlier works [46,47], have been used to grow the present NiO and CoO films.…”
Section: Resultssupporting
confidence: 72%
See 2 more Smart Citations
“…The MgO(001) single-crystal substrate was ex-situ cleaved just before inserting into UHV and annealed at 573 K for 30 min to clean the surface. Both CoO and NiO layers were prepared in situ by deposition of metallic Co and Ni in a directed oxygen partial pressure of 1 × 10 −6 mbar at a sample temperature of 473 K [36,37]. High purity metals (99.995%) Ni and Co were evaporated from an e-beam evaporator and a hightemperature effusion cell, with a constant rate of 0.4 Å min −1 and 0.2 Å min −1 , respectively.…”
Section: Methodsmentioning
confidence: 99%