2007
DOI: 10.1007/s10836-007-5025-3
|View full text |Cite
|
Sign up to set email alerts
|

A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

0
5
0

Year Published

2010
2010
2018
2018

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 8 publications
(5 citation statements)
references
References 8 publications
0
5
0
Order By: Relevance
“…Current-based sensors [6,10] or dedicated measurement modules [11,12] have also been employed to measure or predict the performance of some blocks in the receiver chain. All these strategies require connections of the BIT circuitry either to the signal path or to the bias network, and sometimes require the insertion of switches to reconfigure the system under test and to route the RF signal to internal meters in test mode.…”
Section: Introductionmentioning
confidence: 99%
“…Current-based sensors [6,10] or dedicated measurement modules [11,12] have also been employed to measure or predict the performance of some blocks in the receiver chain. All these strategies require connections of the BIT circuitry either to the signal path or to the bias network, and sometimes require the insertion of switches to reconfigure the system under test and to route the RF signal to internal meters in test mode.…”
Section: Introductionmentioning
confidence: 99%
“…The built-in CMOS current sensor (BICS) was designed to monitor the current consumption (I DD ) of integrated circuits, as it is a simple method for detecting defects missed by conventional logic tests [Cimino 2007]. The sensor uses a parasitic 10 Ω resistor in the IC interconnecting layer; the effect of the process parameter variation is reduced by a ratiometric circuit.…”
Section: Built-in Current Testing and Embedded Sensorsmentioning
confidence: 99%
“…The built-in CMOS current sensor (BICS) was designed to monitor the current consumption (I DD ) of integrated circuits, as it is a simple method for detecting defects missed by conventional logic tests (Cimino et al 2007).…”
Section: Built-in Current Testing and Embedded Sensorsmentioning
confidence: 99%
“…Conventionally, changes in circuit parameters and working environments were included in the design, which affects the overall performance of the circuit. For instance, inserting dummy sensors in addition to active and passive devices reduces the effect of such parametric variations . Since the mismatch of input impedance and output impedance of the LNA leads to minimize power transformation, with the proper tuning of a tank circuit, LNA can be optimized .…”
Section: Introductionmentioning
confidence: 99%
“…For instance, inserting dummy sensors in addition to active and passive devices reduces the effect of such parametric variations. 6 Since the mismatch of input impedance and output impedance of the LNA leads to minimize power transformation, with the proper tuning of a tank circuit, LNA can be optimized. 7,8 This optimization procedure is challenging, resulting in trade-offs between gain and noise figure.…”
mentioning
confidence: 99%