A robust approach for comparison and validation of large signal measurement systems

Williams, T.; Mojon, O.; Woodington, S.; Lees, Jonathan; Fernandez-Barciela, M.; Benedikt, J.; Tasker, P.J.

doi:10.1109/mwsym.2008.4633152

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Cited by 7 publications

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“…Advancement in large-signal and waveform measurement systems [1], [2] has created an opportunity for direct utilization of measurement data (specifically load-pull measurement) into the computer-aided design (CAD) environment [3]. However, the generality requirement of advanced radiofrequency power amplifier (RFPA) designs demands load-pull data under various variables such as frequency, input power, and DC bias voltage which can be very time-consuming.…”

Section: Introductionmentioning

confidence: 99%

New Formulation of Cardiff Behavioral Model Including DC Bias Voltage Dependence

Azad¹,

Bell²,

Quaglia³

et al. 2022

IEEE Microw. Wireless Compon. Lett.

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Section: Introductionmentioning

confidence: 99%

New Formulation of Cardiff Behavioral Model Including DC Bias Voltage Dependence

Azad¹,

Bell²,

Quaglia³

et al. 2022

IEEE Microw. Wireless Compon. Lett.

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Large-signal vector measurement techniques with NVNAs

Roblin

2011

Nonlinear RF Circuits and Nonlinear Vector Network Analyzers

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Effect of impedance variation around the fundamentals on PA distortions characteristics under wideband multi-tone stimulus

Hashim

Hashmi

Benedikt

et al. 2010

2010 IEEE Asia Pacific Conference on Circuits and Systems

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Characterisation of modern wireless power transistors and amplifies requires widebandmodulated stimuli for realistic performance evaluation. Normally power transistor performance is evaluated using passive load-pull techniques. However, these have some physical realization constraints that influence the amplitude and the phase of the presented impedance at the DUT plane as across the modulated bandwidth. The problem becomes more apparent as modulation bandwidth is increased beyond few MHz. It has been shown recently that a digitally controlled active envelop load-pull (ELP) system can completely address this problem [1], thus allowing for a more systematic investigation of the parameters that may affect the performance of power transistors under wideband-modulated stimuli. In this paper, non ideal multi-tone impedance conditions are purposely introduced for demonstrating their effects on power amplifier performance in order to illustrate the DUT sensitivity to measurement system imperfections at higher modulation bandwidths in excess of few MHz.

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A robust approach for comparison and validation of large signal measurement systems

Cited by 7 publications

References 5 publications

New Formulation of Cardiff Behavioral Model Including DC Bias Voltage Dependence

New Formulation of Cardiff Behavioral Model Including DC Bias Voltage Dependence

Large-signal vector measurement techniques with NVNAs

Effect of impedance variation around the fundamentals on PA distortions characteristics under wideband multi-tone stimulus

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