A Robust Architecture for Flip-Flops Tolerant to Soft-Errors and Transients from Combinational Circuits

Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation

“…This study broadly classifies the techniques into three categories: (1) radiation hardened by redundancy; (2) radiation hardened by circuit design; and (3) radiation hardened by process. Popular implementations for the first category include either Dual Redundancy (DR) with Muller C-element or Triple Modular Redundancy (TMR) with majority voting [8,9]. DR uses full redundancy to detect errors, while TMR can detect and correct an error in case of a single event; however, both techniques incur a substantial penalty in power and delay due to the required redundancy and this work is confined to stand-alone rad-hard sequential elements that were hardened by circuit design and process.…”