2008
DOI: 10.1117/12.758933
|View full text |Cite
|
Sign up to set email alerts
|

A robust electro-optothermal coupling scheme for semiconductor laser simulation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2013
2013
2013
2013

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…However, the filter aperture cannot actually solve the problem of nonuniform current-density distribution. There have been many other studies on the current injection of VC-SEL devices, such as investigating the relationship between current injection and wall-plug efficiency [16,17] or the thermal behavior [18][19][20] of VCSEL devices. However, how to eliminate the CSD effect was not mentioned in those studies.…”
Section: Introductionmentioning
confidence: 99%
“…However, the filter aperture cannot actually solve the problem of nonuniform current-density distribution. There have been many other studies on the current injection of VC-SEL devices, such as investigating the relationship between current injection and wall-plug efficiency [16,17] or the thermal behavior [18][19][20] of VCSEL devices. However, how to eliminate the CSD effect was not mentioned in those studies.…”
Section: Introductionmentioning
confidence: 99%