2022
DOI: 10.1109/tpel.2021.3130085
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A Robust Testing Method for DC and AC Capacitors With Minimum Required Power Supply

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Cited by 10 publications
(6 citation statements)
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“…As discussed in [8], there are two emerging demands for capacitor testing in power electronics applications. The first is parameter characterizations under realistic operating points beyond what is provided in supplier datasheets.…”
Section: Kv/ka Capacitor Testing Systemmentioning
confidence: 99%
See 2 more Smart Citations
“…As discussed in [8], there are two emerging demands for capacitor testing in power electronics applications. The first is parameter characterizations under realistic operating points beyond what is provided in supplier datasheets.…”
Section: Kv/ka Capacitor Testing Systemmentioning
confidence: 99%
“…Nevertheless, extending their testing specifications is challenging due to the required power supply voltage and current ratings and the incapability of dealing with capacitor mismatch among different samples. Therefore, a new testing circuit is proposed and implemented with the details discussed in [8].…”
Section: Kv/ka Capacitor Testing Systemmentioning
confidence: 99%
See 1 more Smart Citation
“…However, only single electrolytic stresses can be emulated at the same time in those testing methods. Existing methods for emulating realistic high-power capacitor electrical stress have limitations, either being unable to provide the megawatt-level testing requirements in high-power applications [11]- [18] or being able to provide such requirements but with the need for multiple test benches or longer testing time [19].…”
Section: Introductionmentioning
confidence: 99%
“…Apart from statistics and empirical failure-rate models (e.g., the MIL-HDBK-217 [54]), the physics-offailure (PoF) based analysis has been developed in recent years to better accommodate power electronics applications involving multiple components and miscellaneous mission profiles (operation conditions) [55], [56]. In existing literature, many methodologies have been proposed for the testing or condition monitoring of power semiconductors [57]- [61] and capacitors [62], [63], etc., which are among the most fragile components (Fig. 1.6 [64]).…”
Section: Useful Lifetimementioning
confidence: 99%