A scalable quantitative measure of IR-drop effects for scan pattern generation

Wu, Ming‐Fang; Tsai, Kun-Han; Cheng, Wu-Tung; Pan, Heng‐Chih; Huang, Jiun-Lang; Kifli, Augusli

doi:10.1109/iccad.2010.5654130

Cited by 2 publications

(5 citation statements)

References 8 publications

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“…Finally, we substitute (19) into middle term of right-hand side of (18), ignoring constant and other terms not related to r p , we can derive the contribution C r p ,n j as (22). Thus, to calculate (22), a total of |R| × |N | calculations are required.…”

Section: B Contributionmentioning

confidence: 98%

“…We substitute (4) into (17), ignoring constant terms and other terms not related to r p , we can derive the contribution C r p ,ri as (19). Thus, to calculate (19), a total of |R| 2 calculations are required, each of which is O(1), assuming D r p is bounded by a constant C r p ,r i = I r p m∈D r p g r p ,m…”

Section: B Contributionmentioning

confidence: 98%

“…Thus, to calculate (19), a total of |R| 2 calculations are required, each of which is O(1), assuming D r p is bounded by a constant C r p ,r i = I r p m∈D r p g r p ,m…”

Section: B Contributionmentioning

confidence: 99%

“…FAIR x is simply the summation of contribution of all nodes to node x except home node. We can easily calculate FAIR r i of a representative node r i by substituting (4) into (19) and then the result substitutes into (17), ignoring constant terms. We can obtain…”

Section: Fast Average Ir Drop (Fair) Estimationmentioning

confidence: 99%

“…X-filling assigns 0s and 1s to unspecified bits (X) in a test pattern for reducing FFTC, which was presented in [18]. A quantitative IR-drop measurement for the guidance of scan pattern generation was presented in [19]. A new metric measuring the switching cycle average power of at-speed test patterns was presented in [20].…”

Section: Introductionmentioning

confidence: 99%

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Test Pattern Modification for Average IR-Drop Reduction

Ding

Hsieh

Han

et al. 2016

IEEE Trans. VLSI Syst.

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This paper presents a novel technique that modifies automatic test pattern generation test patterns to reduce timeaveraged IR drop of a test pattern. We propose a fast average IR drop estimation, which is very close to the time-averaged IR drop of time-consuming transient simulation (R 2 = 0.99). We calculate the contribution of every node to these nodes inside IR-drop hotspot so that we can effectively modify only a few don't care bits in the test patterns to reduce IR drop. The experimental results show that our technique successively reduces time-averaged IR drop by 10% with almost no fault coverage loss and no test pattern inflation.

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Section: B Contributionmentioning

confidence: 98%

Section: B Contributionmentioning

confidence: 98%

“…Thus, to calculate (19), a total of |R| 2 calculations are required, each of which is O(1), assuming D r p is bounded by a constant C r p ,r i = I r p m∈D r p g r p ,m…”

Section: B Contributionmentioning

confidence: 99%

Section: Fast Average Ir Drop (Fair) Estimationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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