A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

Warwick, Tony; Franck, K.; Kortright, J. B.; Meigs, G.; Moronne, Mario M.; Myneni, Satish Chandra Babu; Rotenberg, Eli; Seal, Sudipta; Steele, W.F.; Ade, Harald; García, Adrián Luis García; Cerasari, S.; Denlinger, Jonathan D.; Hayakawa, Shinjiro; Hitchcock, Adam P.; Tyliszczak, Tolek; Kikuma, Jun; Rightor, E. G.; Shin, Hyun‐Joon; Tonner, B. P.

doi:10.1063/1.1149041

Cited by 101 publications

(70 citation statements)

References 13 publications

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“…In addition, scanning transmission X-ray microscopes (STXMs) operating at the National Synchrotron Light Source and Advanced Photon Source have been used for nano-tomography. The latest laboratory-based X-ray nano-tomography can achieve a resolution of 400 nm with detectability of 100-200 nm (McNulty et al, 1995;Warwick et al, 1998;Cai et al, 2000;Parkinson and Sasov, 2008). Recently, X-raymicro-tomography has been used to quantify liquid water saturation distribution in porous GDLs and determining the Q1 two-phase material parameters with a sub 10 mm resolution (Becker et al, 2008;Sinha et al, 2006).…”

Section: Introductionmentioning

confidence: 99%

Influence of threshold variation on determining the properties of a polymer electrolyte fuel cell gas diffusion layer in X-ray nano-tomography

Ostadi

Rama

Liu

et al. 2010

Chemical Engineering Science

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Morphological parameters of a 3D binary image of a porous carbon gas diffusion layer (GDL) for polymer electrolyte fuel cells (PEFC) reconstructed using X-ray nano-tomography scanning have been obtained, and influence of small alterations in the threshold value on the simulated flow properties of the reconstructed GDL has been determined. A range of threshold values with 0.4% increments on the greyscale map have been applied and the gas permeability of the binary images have been calculated using a single-phase lattice Botlzmann model (LBM), which is based on the treatment of nineteen velocities in the three dimensional domain (D3Q19). The porosity, degrees of anisotropy and the mean pore radius have been calculated directly from segmented voxel representation. A strong relationship between these parameters and threshold variation has been established. These findings suggest that threshold selection can significantly affect some of the flow properties and may strongly influence the computational simulation of micro and nano-scale flows in a porous structure.

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Section: Introductionmentioning

confidence: 99%

Influence of threshold variation on determining the properties of a polymer electrolyte fuel cell gas diffusion layer in X-ray nano-tomography

Ostadi

Rama

Liu

et al. 2010

Chemical Engineering Science

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“…-optical microscopies, where magneto-optic Kerr microscopy is one of the most widely known techniques [3,4]; -electron microscopies, including scanning electron microscopy with polarization analysis (SEMPA) [5,6], Lorentz microscopy [7,8], and electron holography [9,10]; -scanning probe microscopies such as magnetic force microscopy (MFM) [11,12], spin-polarized scanning tunneling microscopy (SP-STM) [13], or ballistic emission magnetic microscopy (BEMM) [14,15]; -soft X-rays microscopies, including X-ray photoemission electron microscopy (X-PEEM) [16,17] and scanning transmission X-ray microscopy (STXM) [18,19].…”

Section: Introductionmentioning

confidence: 99%

Magnetic imaging with spin-polarized low-energy electron microscopy

Rougemaille

Schmid²

2010

Eur. Phys. J. Appl. Phys.

116

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Abstract. Spin-polarized low-energy electron microscopy (SPLEEM) is a technique for imaging magnetic microstructures at surfaces and in thin films. In this article, principles, advantages and limitations of SPLEEM are reviewed. Several recent studies illustrate how SPLEEM can be used to investigate spin reorientation transition phenomena, to determine magnetic domain configurations in low-dimensional structures, or to explore physics of magnetic couplings in layered systems. The work highlights the capability of the technique to reveal in situ and in real time quantitative information on micromagnetic configurations and structure-property relationships. In addition, spectroscopic reflectivity measurements with spin-polarized low-energy electron beams can be a useful tool to probe spin-dependent unoccupied band structure of magnetic materials and electronic properties of buried magnetic interfaces.

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“…The microscopically structured edges of our model gels were examined with the scanning transmission X-ray microscope (STXM) at beamline 7.0 at the Advanced Light Source in Berkeley, which has been described elsewhere. 26 Briefly, this instrument utilizes Fresnel zone plate technology to focus the X-ray beam to a spot, nominally 45 nm in diameter. The sample is scanned across the beam using stepping motor and piezoelectric driven stages, and the transmitted intensity is detected by down-converting the photons to visible light and counting photons with a photomultiplier tube.…”

Section: Methodsmentioning

confidence: 99%

Quantitative Characterization of Microscopic Variations in the Cross-Link Density of Gels

et al. 2001

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We report the visualization and quantitative analysis of the cross-link structure in model core/shell hydrogel polymers on the microscopic scale, in a fully swollen state, using soft X-ray microscopy. The cross-link density in these materials and their microscopic or even nanoscopic variation critically influence materials characteristics, yet the cross-link density is difficult to characterize by conventional methods. By the use of soft X-ray microscopy, one can investigate these materials in a fully swollen state and thus directly visualize and quantitatively determine the cross-link structure on a microscopic scale. Materials that were cross-linked by different methods were shown to give rise to differently shaped profiles. Abrupt and gradient cross-link density profiles have been investigated, and the spatial variation in their cross-link density has been determined quantitatively.

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A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

Cited by 101 publications

References 13 publications

Influence of threshold variation on determining the properties of a polymer electrolyte fuel cell gas diffusion layer in X-ray nano-tomography

Influence of threshold variation on determining the properties of a polymer electrolyte fuel cell gas diffusion layer in X-ray nano-tomography

Magnetic imaging with spin-polarized low-energy electron microscopy

Quantitative Characterization of Microscopic Variations in the Cross-Link Density of Gels

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