A short working distance multiple crystal x-ray spectrometer

Abstract

For x-ray spot sizes of a few tens of microns or smaller, a millimeter-sized flat analyzer crystal placed approximately 1 cm from the sample will exhibit high energy resolution while subtending a collection solid angle comparable to that of a typical spherically bent crystal analyzer (SBCA) at much larger working distances. Based on this observation and a nonfocusing geometry for the analyzer optic, we have constructed and tested a short working distance (SWD) multicrystal x-ray spectrometer. This prototype instrument has a maximum effective collection solid angle of 0.14 sr, comparable to that of 17 SBCA at 1 m working distance. We find good agreement with prior work for measurements of the Mn Kbeta x-ray emission and resonant inelastic x-ray scattering for MnO, and also for measurements of the x-ray absorption near-edge structure for Dy metal using Lalpha(2) partial-fluorescence yield detection. We discuss future applications at third- and fourth-generation light sources. For concentrated samples, the extremely large collection angle of SWD spectrometers will permit collection of high-resolution x-ray emission spectra with a single pulse of the Linac Coherent Light Source. The range of applications of SWD spectrometers and traditional multi-SBCA instruments has some overlap, but also is significantly complementary.

A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

“…The curvature itself does not significantly affect instrumental resolution since the curved focal line can be taken into account to produce a spectrum, as is commonly done in synchrotron implementations. 40,54,56 In the present spectrometer in the laboratory setting, however, the curvature of the signal convolved with the large spot illumination results in irreversible blurring of the ideal point-source response function for regions of the sensor far out of the Rowland plane. In order to maintain high resolution for lab-based measurements, this requires that the signal on the detector be cropped around the region centered on the Rowland plane to exclude these blurred regions.…”

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

“…It was demonstrated that based on a multiple-crystal array affixed on a spherical substrate, a good energy resolution and a large solid collection angle can be achieved. [37][38][39] The use of diced or segmented-type optics leads to a simple spectrometer that is easy to implement for any scattering geometry.…”

Microbeam X-ray analysis of Ce3+/Ce4+ in Ti-rich minerals: A case study with titanite (sphene) with implications for multivalent trace element substitution in minerals

“…The XANES technique provides a methodology by which Ce 3+ /Ce 4+ in Ti-rich materials can be determined. The recently developed Minixs high-energy resolution X-ray fluorescence analyzer, which uses flat crystals in a quasi-Johann or von Hamos arrangement in conjunction with a two-dimensional position-sensitive detector to measure a range of emission energies for a given incident energy, will greatly facilitate this kind of analysis in the future (Dickinson et al 2008;Mattern et al 2012).…”