A novel trench gates double reduced surface field (RESURF) lateral insulated gate bipolar transistor based on silicon-on-insulator (SOI-LIGBT) is proposed and investigated. A p-top layer connected to the Emitter via two series diodes and n-rings surrounding the bottom of trench gates are used to reduce the on-state voltage drop (VCE(sat)) and turn-off loss (Eoff). A deep trench with a p-ring is introduced to form a gate-drain shorted PMOS, which can automatically raise the potential of the p-ring during turning off so as to enhance the dynamic avalanche immunity. Besides, the deep trench with a p-ring can shield the high electric field from n-rings at the blocking state, which avoids the breakdown of n-rings. Simulation results indicate that, the proposed LIGBT can be safely turned off even under a bus voltage equal to the breakdown voltage (VB), and VCE(sat) under Eoff = 1 mJ/cm2 can be 24% lower than that of the conventional LIGBT.