A simplified polynomial-fitting algorithm for DAC and ADC BIST

Sunter, Stephen; Nagi, N.

doi:10.1109/test.1997.639641

Cited by 122 publications

(63 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The more used technique is the polynomial fitting method [2,9,10,12]. This technique consists in describing the INL (or the transfer function of the ADC) as an n-order polynomial:…”

Section: Polynomial Fitting Techniquementioning

confidence: 99%

“…In [3,10], an low order polynomial is proposed. In [3], the wobbling technique is used to stabilize the harmonic bins during the correlation phase between polynomial coefficients and harmonic amplitudes.…”

Section: Polynomial Fitting Techniquementioning

confidence: 99%

“…Two very different approaches can be used to evaluate the relationship between static and dynamic specifications: a) a statistical approach proposed in [2] consists in detecting devices whose one of functional parameter is overrun specifications, but this kind of statistical method is not viable in a BIST context; b) an analytical approach that consists in identifying the Fourier coefficients obtained with the classical FFT, with the parameters that describe the INL curve. Most of proposed techniques are based on polynomial interpolation of INL [1,3,10,12], a more recent one [6] is based on the Fourier series expansion of the INL.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

A First Step for an INL Spectral-Based BIST: The Memory Optimization

Kerzérho

Bernard

Cauvet³

et al. 2006

J Electron Test

View full text Add to dashboard Cite

International audienceIntegral non-linearity (INL) is the main static parameter of analog-to-digital converter. This paper presents a comparison between different INL test techniques based on INL estimation from the spectrum of the converted signal. The most common technique is based on polynomial fitting of the INL curve. This technique is well suited to the estimation of a smooth INL curve without sharp transitions. The new method described in the paper is based on a Fourier series expansion of the INL curve. We demonstrate that this new technique allows a more efficient INL estimation. The comparison between the two techniques has been realized thanks to a metrics that considers the uncertainty of production test measurements. Finally, we propose a first step of the study of implementation feasibility of the INL estimation technique. This study focus only on the optimization of required memory

show abstract

“…The more used technique is the polynomial fitting method [2,9,10,12]. This technique consists in describing the INL (or the transfer function of the ADC) as an n-order polynomial:…”

Section: Polynomial Fitting Techniquementioning

confidence: 99%

Section: Polynomial Fitting Techniquementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

A First Step for an INL Spectral-Based BIST: The Memory Optimization

Kerzérho

Bernard

Cauvet³

et al. 2006

J Electron Test

View full text Add to dashboard Cite

show abstract

“…To overcome these problems, several authors have proposed different BIST techniques where signals are internally generated and/or analysed [1][2][3][4][5][6][7]. Another possible and less expensive solution consists in using DFT techniques to internally transform the analogue signals into digital signals that are made controllable and observable from the chip I/Os [3,8,9].…”

Section: Introductionmentioning

confidence: 99%

A multi-converter DFT technique for complex SIP: Concepts and validation

Kerzérho

Cauvet

Bernard

et al. 2009

2009 European Conference on Circuit Theory and Design

View full text Add to dashboard Cite

show abstract

“…The OBIST technique 31 , suitable for both functional and defect oriented testing, is based on the oscillation test methodology. Finally, a promising approach to calculate analogue parameters for DAC's and ADC's has been presented by Sunter and Nagi 32 . In the majority of cases, the effort and initial financial investments required to integrate DfT are usually justified, as either test cost or test quality is improved.…”

Section: State-of-the-art In Analogue and Mixed Signal Testingmentioning

confidence: 99%