A single probe for imaging photons, electrons and physical forces

Abstract

The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.

Controlling optics contamination at the PolLux STXM

“…We have also used an ex-situ H 2 plasma in a Diener Atto plasma cleaner (Diener, Germany) for cleaning the inner surfaces of channeltron electron multupliers. The channeltrons were used for experiments in PolLux [20,21] and NanoXAS [22,23] and strong performance improvements were observed after H 2 plasma treatments. The PolLux STXM endstation is designed for use in low-or high-vacuum, and to be routinely vented (with dry N 2 ) for the exchange of samples and accessory apparatus.…”