2018
DOI: 10.1088/1748-0221/13/04/c04001
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Controlling optics contamination at the PolLux STXM

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Cited by 13 publications
(10 citation statements)
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“…ref. [31]), specifically if compared to other X-ray microscopy installations. The chemical composition of fixed skin is not exactly known, so that the conversion into an absolute vertical scale may lead to substantial errors (cf.…”
Section: Resultsmentioning
confidence: 99%
“…ref. [31]), specifically if compared to other X-ray microscopy installations. The chemical composition of fixed skin is not exactly known, so that the conversion into an absolute vertical scale may lead to substantial errors (cf.…”
Section: Resultsmentioning
confidence: 99%
“…Ru samples were composed of a 200 nm thick Ru(0001) film deposited on a yttria-stabilized-zirconia film on top of a Si(111) substrate [17]. As-received samples were first cleaned ex situ in a UV/ozone cleaner [18], followed by thermal annealing in HV (10 −8 mbar) to 700 • C. The samples were not ion sputter cleaned as this damaged the crystallinity and was not required to remove contaminants. More information about sputtering damage is provided in the supporting information (SI) section S1.…”
Section: Methodsmentioning
confidence: 99%
“…The bright horizontal band observed both before and after installing the shield corresponds to the path of the X-ray beam, which is made visible due to emission by a small pressure of oxygen in the chamber for in situ removal of carbon contamination on the mirror (e.g. Toyoshima et al, 2012;Watts et al, 2018). Strong light is also observed around the mirror surface before installing the shield, which may be due to the reflection of visible light from the viewport.…”
Section: First-mirror Chambermentioning
confidence: 96%