2009
DOI: 10.1017/s1431927609096068
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A Solution to the Problem of X-Ray Mapping Samples with Surface Roughness

Abstract: X-ray mapping by EDS techniques of rough samples or samples with a complex topographic surface is more difficult than mapping relatively smooth surfaces. The problem of the sample with a rough surface arises because a lower intensity of an element, or even no intensity, can either mean the absence of that element or it can mean the element has a significant presence but the area can not be "viewed" by the EDS detector (Fig. 1). This problem or ambiguity can be partially solved by the use of a second detector w… Show more

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Cited by 2 publications
(3 citation statements)
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“…The previous experiments gave strong evidence that EDX works well for layer thickness evaluation from several nanometers to micrometers on planar surfaces. However, there is a big deviation for nonplanar or rough samples which is due to the geometry/morphology. ,, To understand more details, simulation work based on a simplified model system was performed (Figure ). The methodology for this work is to use a tilted flat specimen to mimic the geometric effect on the particle surface, which is meant to represent geometry differences, e.g., different locations on the spherical sample.…”
Section: Resultsmentioning
confidence: 99%
“…The previous experiments gave strong evidence that EDX works well for layer thickness evaluation from several nanometers to micrometers on planar surfaces. However, there is a big deviation for nonplanar or rough samples which is due to the geometry/morphology. ,, To understand more details, simulation work based on a simplified model system was performed (Figure ). The methodology for this work is to use a tilted flat specimen to mimic the geometric effect on the particle surface, which is meant to represent geometry differences, e.g., different locations on the spherical sample.…”
Section: Resultsmentioning
confidence: 99%
“…97,98 The XEDS mapping of non-planar surfaces continues to be a challenge and some attempts to use multiple detectors to improve this type of analysis still present data interpretation limitations. 99 The technical and scientific literature shows that EBSD applications continue to expand with the introduction of better processing software and faster and more sensitive detectors. Nevertheless, important areas such as strain quantification at the submicron scale continue to be a challenge and the limits of this field are yet to be determined.…”
Section: Perspectives For In Situ Sem Studiesmentioning
confidence: 99%
“…Therefore, parallel use of multiple XEDS detectors to improve the effective collection angle allows much faster data acquisition and may have an impact on in situ experiments requiring time resolved chemical information 97, 98. The XEDS mapping of non‐planar surfaces continues to be a challenge and some attempts to use multiple detectors to improve this type of analysis still present data interpretation limitations 99…”
Section: Perspectives For In Situ Sem Studiesmentioning
confidence: 99%