A statistical evaluation of the field emission for copper oxide nanostructures

Rocha, M S F da; Santos, Thebano E. A.; Paulo, Anderson Caetano; Hering, Vitor Renaux; Engelsen, Daniel den; Vuolo, José Henrique; Mammana, S. S.; Mammana, Victor Pellegrini

doi:10.1016/j.apsusc.2007.07.172

Cited by 5 publications

(2 citation statements)

References 13 publications

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“…Assuming one of the relationships between radius, height, and field enhancement factors listed above, equations for constant height and constant radius can also be derived. 10,13,[19][20][21][22] In SK-plots, a linear relationship between the slope and the intercept is often observed. 13,19,20,23 However, this linear relationship cannot easily be explained assuming only a change in a single parameter, such as the radius.…”

Section: Slope-intercept Plotsmentioning

confidence: 99%

Analysis of slope-intercept plots for arrays of electron field emitters

Persaud

2013

Journal of Applied Physics

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In electron field emission experiments, a linear relationship in plots of slope vs. intercept obtained from Fowler-Nordheim analysis is commonly observed for single tips or tip arrays. By simulating samples with many tips, it is shown here that the observed linear relationship results from the distribution of input parameters, assuming a log-normal distribution for the radius of each tip. Typically, a shift from the lower-left to the upper-right of a slope-intercept plot has been correlated with a shift in work function. However, as shown in this paper, the same effect can result from a variation in the number of emitters

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Section: Slope-intercept Plotsmentioning

confidence: 99%

Analysis of slope-intercept plots for arrays of electron field emitters

Persaud

2013

Journal of Applied Physics

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“…22,23 The statistical evaluation of the field-emission properties of the same Cu x O nanostructures and Seppen-Katamuki analysis is presented in another publication of our team. 24 Since our goal is to select the best nanostructure for integration into the copper-dielectric multilayer as described above, this paper is focused on field-emission measurements for various types of copper oxide nanostructures obtained at room temperature and comparison with CNT performance, deposited by sprinkling CNT over silver paste and the electrophoresis of CNT suspensions. Moreover, we include process aspects as a criterion for nanostructure selection, such as the particular coating technology and selectiveness of depositing the nanostructures.…”

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confidence: 99%

Selection of nanostructures for porous field‐emission display

Mammana¹,

Hering²,

Paulo³

et al. 2007

J Soc Info Display

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This paper describes the evaluation of nanostructures to be integrated into porous fieldemission displays (pFEDs), based on a multilayer of copper and polyimide, pierced by holes. The evaluation work is based on diode-mode measurements performed with carbon nanotubes and nanostructured copper oxide samples obtained through wet chemical processes. A special characterization tool, based on the curve method, was used to obtain current vs. field characteristics in a repetitive and reproducible method. Histograms of threshold fields for 46 samples are presented, allowing for a comparison between different methods of nanostructure formation, which shows that carbon nanotubes yield a threshold field which is at least five times smaller than that for copper oxides.

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