2019 8th International Conference on Renewable Energy Research and Applications (ICRERA) 2019
DOI: 10.1109/icrera47325.2019.8997100
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A Study of a Newly Developed Kelvin-Source Driven SiC-VMOSFET on a High-Power Single-Ended Wireless EV Charger

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Cited by 9 publications
(2 citation statements)
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“…V groove trench gate construction realizes high breakdown voltage and very low ON‐resistance. Ron of the new device VMOS is only 35 mΩ which is 1 of 3 compared with Ron 83 mΩ of conventional gate device DMOS [2,3].…”
Section: The Dawn Period For Power‐electronics Home Appliancesmentioning
confidence: 99%
“…V groove trench gate construction realizes high breakdown voltage and very low ON‐resistance. Ron of the new device VMOS is only 35 mΩ which is 1 of 3 compared with Ron 83 mΩ of conventional gate device DMOS [2,3].…”
Section: The Dawn Period For Power‐electronics Home Appliancesmentioning
confidence: 99%
“…Silicon carbide (SiC) power semiconductors have excellent characteristics such as a high breakdown field, high thermal conductivity, low on-resistance, and fast switching speed compared to those of silicon (Si) power semiconductors [1][2][3][4][5][6][7]. Owing to these advantages, SiC power semiconductors are employed in various applications, such as in electric vehicle chargers [8][9][10], multilevel inverters [11], induction heaters [12], fuel cell systems [13], and wireless power transmission [14].…”
Section: Introductionmentioning
confidence: 99%