It was shown that under‐coordinated topological defects induced by high‐energy γ‐irradiation can be a reason for significant changes in positron annihilation lifetime spectra of multicomponent chalcogenide glassy semiconductors within ternary Ge‐As(Sb)‐S systems. In the case of negatively‐charged sulphur and arsenic atoms, the excess of free volume is quite enough to produce additional input in the second defect‐related channel of positron trapping, while under‐coordinated germanium atoms are practically non‐detectable with this technique because of low associated free volume. Despite radiation‐induced densification, the average positron lifetime demonstrate both growing and decaying tendencies after γ‐irradiation depending on glass composition. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)