2000
DOI: 10.1002/1521-4079(200010)35:10<1163::aid-crat1163>3.0.co;2-c
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A Study on Carbon Incorporation in Semi-Insulating GaAs Crystals Grown by the Vapor Pressure Controlled Czochralski Technique (VCz) Part I: Experiments and Results

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Cited by 5 publications
(3 citation statements)
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“…For the first time in such experiments without boric oxide encapsulant, the carbon concentration could be reduced markedly by using the controlling gas mode already described earlier [23]. Up to now there was no experimental evidence whether the presence of the boric oxide layer is necessary for this process.…”
Section: Article In Pressmentioning
confidence: 99%
“…For the first time in such experiments without boric oxide encapsulant, the carbon concentration could be reduced markedly by using the controlling gas mode already described earlier [23]. Up to now there was no experimental evidence whether the presence of the boric oxide layer is necessary for this process.…”
Section: Article In Pressmentioning
confidence: 99%
“…The control of carbon concentration during vapor pressure-controlled Czochralski (VCz) growth [1], as well as during conventional LEC [2] growth of GaAs crystals, is of crucial importance for achieving the desired electrical crystal parameters. Today, the carbon concentration is commonly adjusted empirically by maintaining a certain CO partial pressure in the growth atmosphere [1,2].…”
Section: Introductionmentioning
confidence: 99%
“…Today, the carbon concentration is commonly adjusted empirically by maintaining a certain CO partial pressure in the growth atmosphere [1,2]. A critical point of this procedure is that it is difficult to transfer the parameters empirically found for a given experimental geometry to another, e.g., to different chamber, crystal, and crucible sizes.…”
Section: Introductionmentioning
confidence: 99%