A study on carrier-removal techniques in fringe projection profilometry

Quan, Chenggen; Tay, Cho Jui; Chen, L.J.

doi:10.1016/j.optlastec.2006.09.003

Cited by 33 publications

(14 citation statements)

References 13 publications

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“…Hence, there is great scope for exploring adaptive windowing scheme in this domain. In addition, though we used spectral peak tracing method for carrier detection, other carrier retrieval techniques [31] can also be explored. Finally, the proposed method does not require preset thresholds for defect identification, unlike existing space-frequency methods, which leads to operational ease and simplicity for the user.…”

Section: Discussionmentioning

confidence: 99%

Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy

2019

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This paper introduces a technique to identify defects from fringe patterns for optical non-destructive testing and metrology. The technique relies on computation of the windowed Fourier spectrum of the fringe pattern at a given spatial frequency, and subsequent application of automated spectrum thresholding to localize the defect. The technique offers the advantages of high robustness against noise, fast implementation, high throughput and minimal operator intervention. The performance of the proposed technique is demonstrated for identifying defects of different types and sizes under varying levels of noise using numerical simulations, and practical validity is tested using experimental interferograms obtained in diffraction phase microscopy.

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Section: Discussionmentioning

confidence: 99%

Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy

2019

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“…The minimum phase map created using geometric constraint of the DFP is used to unwrap the wrapped low frequency phase, and the continuous low frequency phase is shown in Figure 8(e). The continuous high frequency phase is retrieved using dual-frequency temporal phase unwrapping algorithm, as shown in Figure 8(f) (after subtraction of a reference plane (32,33)).…”

Section: Methodsmentioning

confidence: 99%

Enhanced dual-frequency pattern scheme based on spatial-temporal fringes method

Wang

Zhou

et al. 2018

Journal of Modern Optics

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One of the major challenges of employing a dual-frequency phase-shifting algorithm for phase retrieval is its sensitivity to noise. Yun et. al [H Yun, B Li, S Zhang. 2017] proposed a dual-frequency method based on the Fourier transform profilometry (FTP), yet the low frequency lobes are close to each other for accurate band-pass filtering. In light of this problem, a novel dual-frequency pattern based on the spatial-temporal fringes (STF) method is developed in this paper. Three fringe patterns with two different frequency are required. The low frequency phase is obtained from two low frequency fringe patterns by the STF method, so the signal lobes can be extracted accurately as they are far away from each other. The high frequency phase is retrieved from another fringe pattern without the impact of the DC component. Simulations and experiments are conducted to demonstrate the excellent precision of the proposed method.

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“…The nonlinear response of the CCD camera brings unwanted changes to the captured fringe patterns, which lead to non-negligible errors in the three-dimensional shape determination. In FPP, it can be reduced by a calibration technique and nonlinear carrier removal methods (generally referencesubtraction and least-square fitting method 13,25 ). The intensity of the captured fringe image can be expressed as I 0 ðx; yÞ ¼ aðx; yÞ þ X p j¼1 b j ðx; yÞ cosfj½ϕðx; yÞ þ 2πn∕Ng; (10) where 2πn∕N is the phase-shift amount and p is the highest harmonic order of the captured fringes.…”

Section: Nonlinear Errormentioning

confidence: 99%

Phase error analysis and reduction in phase measuring deflectometry

Wu¹,

Yue²,

Yi³

et al. 2015

Opt. Eng

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In phase measuring deflectometry (PMD), the inspection accuracy of the defects and height of the specular surface are related to the level of phase errors. The usage of numeric integration in reconstructing the shape and the defocusing capture of the fringe pattern, which will amplify the phase errors, make error discussion more significant in PMD than other shape measurement techniques. Phase error analysis and reduction in PMD are presented. The random noises, nonlinear response function, the nontelecentric imaging of the charge-coupled device camera, and the nonlinear response function of the liquid crystal display screen are the main phase error sources in PMD. The analytical relation between the random phase error and its influence factors in PMD is deduced. From the relation formulation, the influence factors of random phase error are analyzed, and the results are proven by the simulation and experiment. A possible phase error-reduction method, which integrates several methods for congeneric errors in fringe projection profilometry, is investigated to reduce phase errors in PMD. This composite method is proven to have a good performance by a plane mirror experiment.

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A study on carrier-removal techniques in fringe projection profilometry

Cited by 33 publications

References 13 publications

Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy

Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy

Enhanced dual-frequency pattern scheme based on spatial-temporal fringes method

Phase error analysis and reduction in phase measuring deflectometry

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