“…Note that (8) can be substituted with IL fixt, s in (3), as specified above. The reflecting samples, which can be tested by the method SE 5 , include gaskets, complex PCBs, fabric shield [8], graphene shields [27], band-stop frequency selective surface [28,29] etc. In such cases, (8) can be replaced in (5) when it is written for a sample in the aperture; that is, we can write [10]:…”