2018
DOI: 10.1016/j.ijheatmasstransfer.2018.07.091
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A study on the measurement and prediction of LED junction temperature

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Cited by 29 publications
(16 citation statements)
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“…Preliminary experiments have consisted in optical characterization of LED emitting area. Thus, a Vertex Brucker IRTF spectrometer equipped with separators has been used, respectively for accessing to LED spectra in near [0.8-2.5]µm and medium infrared [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20]µm spectral band. This characterization was performed using a goniometer and assuming lambertian emission, due to LED emitting area dimensions.…”
Section: Preliminary Experimentsmentioning
confidence: 99%
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“…Preliminary experiments have consisted in optical characterization of LED emitting area. Thus, a Vertex Brucker IRTF spectrometer equipped with separators has been used, respectively for accessing to LED spectra in near [0.8-2.5]µm and medium infrared [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20]µm spectral band. This characterization was performed using a goniometer and assuming lambertian emission, due to LED emitting area dimensions.…”
Section: Preliminary Experimentsmentioning
confidence: 99%
“…Therefore, the knowledge of temperature distribution on LED active region (or emitting area) is needed to determine the junction temperature of such optoelectronic component. Different studies have investigated the use of infrared thermography in order to obtain a quantitative heat distribution dissipated by LED [2,3]. However, this technique is limited by the knowledge of the emissivity of LED active region [4,5].…”
Section: Introductionmentioning
confidence: 99%
“…The other is to directly form a matrix with the chips on a PCB (these are called a COB array) [18]. There are two types of COB packages: ceramic substrate and metal substrate [19].…”
Section: Introductionmentioning
confidence: 99%
“…Consequently, good thermal management is beneficial for improving stability and electro-optic conversion efficiency. An important issue is to determine the junction temperature and the thermal resistance [8][9][10] and then to optimize the design for better heat dissipation [11], [12].…”
Section: Introductionmentioning
confidence: 99%