2014
DOI: 10.4028/www.scientific.net/amm.597.184
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A Study on the Resistive Switching of La<sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub> Film Using Spectromicroscopy

Abstract: Resistive random access memory (ReRAM) is a promising candidate for next generation nonvolatile memory. La0.7Sr0.3.MnO3 (LSMO) of perovskite manganite family has a great deal of attention for ReRAM material because it makes resistive switching (RS) of interface type without a “forming process”. However, the full understanding of the electronic structure and RS mechanism of LSMO remains a challenging problem. Therefore, this study performed spectromicroscopic analysis to understand the relation between the chan… Show more

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