2022
DOI: 10.3390/pr10040708
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A Substrate Integrated Waveguide Resonator Sensor for Dual-Band Complex Permittivity Measurement

Abstract: This paper presents a novel dual-band substrate integrated waveguide (SIW) sensor that is designed to measure the complex permittivities of liquids or solid powders at two industrial, scientific, and medical (ISM) frequencies simultaneously. Resonant frequencies and quality factors are obtained from S-parameter measurements with the proposed SIW sensor, and applied to reconstructing the permittivities of materials under test through an artificial neural network. The water–ethanol mixed liquids were measured wi… Show more

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Cited by 12 publications
(3 citation statements)
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“…As a result, SIWs are widely used in RF systems and antenna arrays owing to their advantages of low cost and ease of integration. SIWs can be fabricated using printed circuit boards, low-temperature co-fired ceramics, and other manufacturing processes [ 13 ].…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…As a result, SIWs are widely used in RF systems and antenna arrays owing to their advantages of low cost and ease of integration. SIWs can be fabricated using printed circuit boards, low-temperature co-fired ceramics, and other manufacturing processes [ 13 ].…”
Section: Methodsmentioning
confidence: 99%
“…This method was selected to deal with distributed problems, microwave theoretical analysis, and calculations owing to its advantages of high-speed dynamic response and memory ability. The learning procedure started by inputting a set of tabulating data consisting of f o and Q u extracted from the simulated results, and stopped when the relationship between the calculated relative permittivity and the simulated values of the resonant frequency and Q-factor was mapped [ 13 ]. The real and imaginary parts of the relative complex permittivity could be computed by entering the values of the measured f o and Q u after establishing a two-input, two-output model.…”
Section: Methodsmentioning
confidence: 99%
“…Network parameter methods offer relatively high accuracy over a wide frequency band and require less sample preparation than resonant methods [18], and therefore, are suitable for the measurement of permittivity of high-loss materials. In resonant methods, electromagnetic parameters are measured by changing the resonant frequency and quality factor when a sample is inserted into a measurement cell [19,20]. Resonant methods have high measurement accuracy, but the measurement frequency is only a single point, which is widely used in the measurement of permittivity of low-loss materials [21].…”
Section: Introductionmentioning
confidence: 99%