A tabular review of tunneling spectroscopy

Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy

“…Thus, this technique is a powerful surface and interface analytical tool, and many authors [2][3][4][5][6][7][8][9][10][11][12][13] have reviewed IETS in books and articles. A tabular review 14 for the period from 1968 to 1982 with 283 references and a collection 15 of the tunneling spectra of more than 200 chemical species published from 1966 to 1984 are available.…”