A tandem time‐of‐flight mass spectrometer

Jardine, Daniel; Morgan, John T.; Alderdice, David S.; Derrick, Peter J.

doi:10.1002/oms.1210271018

Cited by 32 publications

(16 citation statements)

References 23 publications

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“…Thus, the simplest form of a tandem (or TOF/TOF) mass spectrometer has a (retarding or accelerating) voltage step. An example (Table 1) is the instru- TOF/RTOF MS2 is a quadratic reflectron Giannakopoulos et al [6] ment designed in 1992 by Jardine et al [7]. However, a retarding or accelerating field will introduce a spread in ion flight times, so that it makes sense to utilize a reflectron to distinguish product and precursor ion flight times while focusing these ions at the same time.…”

Section: Tandem Tof/tof Configurationsmentioning

confidence: 99%

Tandem time-of-flight (TOF/TOF) mass spectrometry and the curved-field reflectron

Cotter

Griffith

Jelinek

2007

Journal of Chromatography B

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Section: Tandem Tof/tof Configurationsmentioning

confidence: 99%

Tandem time-of-flight (TOF/TOF) mass spectrometry and the curved-field reflectron

Cotter

Griffith

Jelinek

2007

Journal of Chromatography B

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“…Cooks and coworkers (41) have described an instrument using two linear time-of-flight analyzers, with fragmentation induced by surface induced dissociation (SID) 9 as well as a more recent version in which the second mass analyzer is a reflectron design (42). Jardine et al (43) have also used two linear analyzers with a gas collision cell. Russell and coworkers (44,45) have developed a sector/time-of-flight hybrid instrument which is described in Chapter 5, while Cornish and Cotter (46) have constructed a tandem time-of-flight (TOF/TOF) mass spectrometer using two reflecting analyzers, that is described in Chapter 6.…”

Section: Tandem Mass Spectrometrymentioning

confidence: 99%

Time-of-Flight Mass Spectrometry

Cotter

1993

ACS Symposium Series

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Since time-of-flight mass spectrometers were first introduced, there has been the need to improve mass resolution, which depends largely upon the initial conditions of the ions at the time they are formed. For larger ions, metastable fragmentation presents an even more serious challenge, although such processes may be utilized to obtain product ion mass spectra in instruments equipped with a reflecting field. Initial conditions and internal energy are all determined during the ionization process, so that ion extraction, focusing, detection, recording and other aspects of time-of-flight analyzer design must be suited to the ionization method used. Thus, this chapter presents the basic principles governing time-of -flight mass measurement and resolution, describes the role of reflectrons and other energy focusing devices, and reviews several unique time-of -flight configurations that have been, or are currently being, used.An attractive feature of the time-of-flight mass spectrometer is its simple design (Figure la). Ions are formed in a short source region (s), defined generally by a backing plate and an extraction grid. A positive voltage (V) placed on the backing plate imposes an electric field (E = V/s) across the source region, which accelerates all of the ions to the same kinetic energy:where m = the mass of the ion, ν = its velocity, e = the charge on an electron, and ζ = number of charges. As the ions pass through the extraction grid they will have velocities which depend inversely upon the square root of their mass: 1/2 [2] IzeEs m 0097-6156/94/0549-0016$09.25/0

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“…0.4 D active ). Unless the actual beam size is substantially less than indicated by this reasoning, which is difficult to imagine, the resolving powers implicit in Figs 6(e)-(g), 8(c) and 9(c) should be close to the upper limits predicted in each case by Eqn (6). If this is so, the time spread within an ion band entering the ion selector should be close to the zero limit, i.e.…”

Section: Resultsmentioning

confidence: 73%

A high resolving power ion selector for post-source decay measurements in a reflecting time-of-flight mass spectrometer

Piyadasa

Håkansson²,

Ariyaratne

et al. 1998

Rapid Commun. Mass Spectrom.

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An electrostatic deflector has been designed and constructed that can be used in a reflecting time-of-flight mass spectrometer for either single-deflector or dual-deflector velocity selection in post-source decay measurements. The deflector consists of an interleaved set of parallel deflection electrodes as in a Loeb/Cravath/Bradbury device, but thin metal ribbon instead of wire is used for the deflection electrodes. The time for reversing the electric field, which depends on various factors such as the electronics for pulsing the voltage and the time constant of a particular electrode geometry, is about 19 ns for the deflectors used in this study. By properly timing the reversal of the electric field, the time-window for ion transmission can be made substantially less than the switching time of each individual deflector. In conjunction with matrix-assisted laser desorption/ionization, the single-deflector's resolving power and transmission are robust with respect to laser fluence, i.e. they remain high even when the fluence is raised well above threshold. By contrast the operational features of the dual-deflector gate offer more versatility in locating and sizing the selection window. Operating the ion selector in a single-deflector mode, we have achieved a resolving power of approximately 710 full width at half maximum (FWHM) for different isotopes of protonated, sodiated, and potassiated substance-P (m/z 1348.6, 1370.6 and 1386.6 respectively; 10.073 keV). Operating it in the dual-deflector mode under two different sets of conditions, we have succeeded in obtaining resolving powers of approximately 1100 (FWHM) for protonated substance-P (m/z 1348.6; 10.8 keV) and approximately 5200 (FWHM) for an isotopomer of PEG 6000 (approximately m/z 6000; 10.04 keV). This accomplishment implies that high-resolution ion selection can be coupled to post-source decay analyses.

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A tandem time‐of‐flight mass spectrometer

Cited by 32 publications

References 23 publications

Tandem time-of-flight (TOF/TOF) mass spectrometry and the curved-field reflectron

Tandem time-of-flight (TOF/TOF) mass spectrometry and the curved-field reflectron

Time-of-Flight Mass Spectrometry

A high resolving power ion selector for post-source decay measurements in a reflecting time-of-flight mass spectrometer

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